No CrossRef data available.
Article contents
Twinning in epilayers of CdTe on <211> Si: Influence of ZnTe buffer layer and substrate misorientation
Published online by Cambridge University Press: 21 February 2011
Abstract
X-ray diffraction spectra of CdTe epilayers grown with and without ZnTe buffer layers on <211> Si substrates by molecular beam epitaxy consist of 422 and 331 reflections. We interpret these as evidence for the existence of twins within the volume of a <211> oriented epilayer and show that twin volume is dependent on the ZnTe buffer layer and substrate misorientation.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1996