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Turbostratic Disorder in [(Bi2Te3)x(TiTe2)y] Superlattices

Published online by Cambridge University Press:  01 February 2011

Fred R. Harris ,
Stacey Standridge ,
Carolyn Feik  and
David C. Johnson
Fred R. Harris
Affiliation:
Department of Chemistry, University of Oregon, Eugene, OR 97403
Stacey Standridge
Affiliation:
Department of Chemistry, University of Oregon, Eugene, OR 97403
Carolyn Feik
Affiliation:
Department of Chemistry, University of Oregon, Eugene, OR 97403
David C. Johnson
Affiliation:
Department of Chemistry, University of Oregon, Eugene, OR 97403
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Abstract

A family of metastable [(Bi2Te3)x(TiTe2)y] superlattices (where × and y denote the number of layers of each of the two components) was prepared by annealing modulated elemental reactant precursors at temperatures below 280°C. Structural analysis by traditional XRD shows the superlattice structures are highly aligned to the substrate with many orders of diffraction peaks from the c direction of the superlattice. Off-axis diffraction techniques presented in this paper suggest that the order between the layers in the a-b direction of these superlattice structures is turbostratic. In this type of behavior, the quasi two-dimensional crystals of Bi2Te3 and TiTe2 that comprise the superlattice structure lie like a deck of cards thrown in disarray on a surface. An analysis of the diffraction data leading to this conclusion is given.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 793: Symposium S – Thermoelectric Materials 2003 - Research and Applications , 2003 , S1.5
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

[1] Venkatasubramanian, R.; Slivola, E.; Colpitts, T.; O'Quinn, B. Nature 2001, 413, 597–602.Google Scholar
[2] Venkatasubramanian, R. Phys. Rev. B: Condens. Matter Mater. Phys. 2000, 61, 3091–3097.Google Scholar
[3] Ren, S. Y.; Dow, J. D. Phys. Rev. B: Condens. Matter Mater. Phys. 1982, 25, 3750–3755.Google Scholar
[4] Harris, F. R.; Standridge, S.; Feik, C.; Johnson, D. C. Angew. Chem., Int. Ed. 2003, 42, 5296–5299.Google Scholar
[5] Arnaud, Y.; Chevreton, M. J. Solid State Chem. 1981, 39, 230–239.Google Scholar
[6] Stordeur, M. CRC Handbook of Thermoelectrics 1995, 239–255.Google Scholar
[7] Koma, A. J. Cryst. Growth 1999, 201/202, 236–241.Google Scholar
[8] Koma, A. Thin Solid Films 1992, 216, 72–76.Google Scholar
[9] Koma, A. Surf. Sci. 1992, 267, 29–33.Google Scholar
[10] Loher, T.; Ueno, K.; Koma, A. Appl. Surf. Sci. 1998, 130–132, 334–339.Google Scholar
[11] Brindley, G. W.; Brown, G. “Crystal structures of clay minerals and their X-ray identification,” 1980.Google Scholar
[12] Moore, D. M.; Reynolds, R. C. X-ray Diffraction and the Identification and Analysis of Clay Minerals, 2nd Edition, 1997.Google Scholar