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Tunable Porous Silicon Mirrors for Optoelectronic Applications

Published online by Cambridge University Press:  11 February 2011

Sharon M. Weiss
Affiliation:
Institute of Optics, University of Rochester, Rochester NY 14627, USA
Mikhail Haurylau
Affiliation:
Department of Electrical and Computer Engineering, University of Rochester, Rochester NY 14627, USA
Philippe M. Fauchet
Affiliation:
Institute of Optics, University of Rochester, Rochester NY 14627, USA Department of Electrical and Computer Engineering, University of Rochester, Rochester NY 14627, USA
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Abstract

Tunable porous silicon mirrors were fabricated as building blocks for optical interconnects and as a first step towards efficient routing of information on a small size scale. The basic structures for the tunable mirrors are porous silicon microcavities infiltrated with liquid crystals. The optical properties of the mirrors are influenced by thermal or electric field modulation. When the device is heated or a voltage is applied, the orientation of the liquid crystals changes, causing a change in the effective refractive index of the liquid crystals within the mirror. The position of the reflectance resonance of the porous silicon microcavity is particularly sensitive to such changes in the refractive index. A reversible 10nm shift of the reflectance resonance of the mirror, leading to a 30% change in the amplitude of reflectance, has been observed due to thermal effects. Not only do these results show potential for future devices, but they also confirm that the liquid crystals are able to rotate in the constricted geometry of the porous silicon microcavities. For voltage driven devices, careful attention needs to be given to the configuration of the electrical contacts. The effectiveness of various device geometries has been investigated. Using standard lithographic techniques, aluminum contacts with minimum feature sizes of 10 microns were patterned directly on the porous silicon surface. A study on the use of free-standing porous silicon films was also performed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

Savage, N., IEEE Spectrum 39, 32 (2002).Google Scholar
Fan, S. and Joannopoulos, J. D., Optics & Photonics News 11, 28 (2000).Google Scholar
3. Pavesi, L., La Rivista del Nuovo Cimento 20 1, (1997).Google Scholar
4. Loni, A., Canham, L. T., Berger, M. G., Arens-Fischer, R., Munder, H., L th, H., Arrand, H. F., Benson, T. M., Thin Solid Films 276, 143 (1996).Google Scholar
5. Leonard, S. W., Mondia, J. P., van Driel, H. M., Toader, O., John, S., Busch, K., Birner, A., Gosele, U., and Lehmann, V., Phys. Rev. B 61, R2389 (2000).Google Scholar
6. Ozaki, M., Shimoda, Y., Kasano, M., and Yoshino, K., Adv. Mater. 14, 514 (2002).Google Scholar
7. Hirschman, K. D., Tsybeskov, L., Duttagupta, S. P., Fauchet, P. M., Nature 384, 338 (1996).Google Scholar
8. Zheng, J. P., Jiao, K. L., Shen, W. P., Anderson, W. A., Kwok, H. S., Appl. Phys. Lett. 61, 459 (1992).Google Scholar
9. Chan, S. and Fauchet, P. M., Appl. Phys. Lett. 75, 274 (1999).Google Scholar
10. Striemer, C. C. and Fauchet, P. M., Appl. Phys. Lett. 81, 2980 (2002).Google Scholar
11. Weiss, S. M. and Fauchet, P. M., Phys. Stat. Sol. A, to be published (2003).Google Scholar
12. E7 liquid crystal data sheet from EM Industries.Google Scholar