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Transmission Electron Microscopy Study of Epitaxial Co/Au and Co/Pd (111) Multilayers

Published online by Cambridge University Press:  25 February 2011

A.E.M. de Veirman ,
F. Hakkens ,
W. Coene  and
F.J.A. Den Broeder
A.E.M. de Veirman
Affiliation:
Philips Research, P.O.Box 80.000, 5600 JA Eindhoven, The Netherlands
F. Hakkens
Affiliation:
Philips Research, P.O.Box 80.000, 5600 JA Eindhoven, The Netherlands
W. Coene
Affiliation:
Philips Research, P.O.Box 80.000, 5600 JA Eindhoven, The Netherlands
F.J.A. Den Broeder
Affiliation:
Philips Research, P.O.Box 80.000, 5600 JA Eindhoven, The Netherlands
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Abstract

The results of a transmission electron microscopy study of Co/Au and Co/Pd multilayers are reported. Special emphasis is put on the epitaxial growth and the relaxation of the misfit strain of these high misfit systems. In bright-field cross-sectional images, periodic contrast fringes are observed at the interfaces, which are the result of Moiré interference and which allow determination of the degree of misfit relaxation at the interface. It was established that 80-85% of the misfit is relaxed. From high resolution electron microscopy images the Burgers vector of the misfit dislocations was derived, being a/2<110> lying in the (111) interface plane. The results obtained for the Co/Au and Co/Pd multilayers will be discussed in comparison with those obtained for a bilayer of Co and Au.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 263: Symposium F – Mechanisms of Heteroepitaxial Growth , 1992 , 119
Copyright
Copyright © Materials Research Society 1992

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References

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