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Transmission Electron Microscope Observations of Lattice Defects Produced During Diffusion Induced Grain Boundary Migration

Published online by Cambridge University Press:  26 February 2011

Re-Jehn Jahn  and
A.H. King
Re-Jehn Jahn
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook NY 11794-2275
A.H. King
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook NY 11794-2275
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Abstract

In a TEM study of diffusion induced grain boundary migration (DIGM) we have found that it is very common for lattice defects to be ejected into the grains adjoining a migrating boundary. The defects may be point defects or dislocations, or both. Dislocation ejection occurs both ahead of and behind moving boundaries, but vacancy deposition appears to occur only behind a moving boundary.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 122: Symposium I – Interfacial Structure, Properties, and Design , 1988 , 213
Copyright
Copyright © Materials Research Society 1988

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References

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