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ToF-SIMS Study of Polymer Nanocomposites.

Published online by Cambridge University Press:  21 March 2011

Vladimir S. Zaitsev ,
Young-Soo Seo ,
Kwanwoo Shin ,
Wenhua Zhang ,
Steven A. Schwarz ,
Jonathan Sokolov  and
Miriam H. Rafailovich
Vladimir S. Zaitsev
Affiliation:
Department of Physics, Queens College of CUNY, Flushing, NY 11367, USA
Young-Soo Seo
Affiliation:
Department of Materials Science and Engineering, SUNY, Stony Brook, NY 11794, USA Department of Physics, Queens College of CUNY, Flushing, NY 11367, USA
Kwanwoo Shin
Affiliation:
Department of Materials Science and Engineering, SUNY, Stony Brook, NY 11794, USA Department of Physics, Queens College of CUNY, Flushing, NY 11367, USA
Wenhua Zhang
Affiliation:
Department of Materials Science and Engineering, SUNY, Stony Brook, NY 11794, USA Department of Physics, Queens College of CUNY, Flushing, NY 11367, USA
Steven A. Schwarz
Affiliation:
Department of Physics, Queens College of CUNY, Flushing, NY 11367, USA
Jonathan Sokolov
Affiliation:
Department of Materials Science and Engineering, SUNY, Stony Brook, NY 11794, USA Department of Physics, Queens College of CUNY, Flushing, NY 11367, USA
Miriam H. Rafailovich
Affiliation:
Department of Materials Science and Engineering, SUNY, Stony Brook, NY 11794, USA Department of Physics, Queens College of CUNY, Flushing, NY 11367, USA
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Abstract

Films of deuterated polystyrene (dPS) and poly(methyl methacrylate) (PMMA) blends, as well as dPS and PMMA and poly(ethylene-co-propylene) (PEP) blends have been spin-cast from toluene solution and annealed at temperatures above their glass transition temperatures for up to 72 hours. Surface topography of the cast and annealed films was measured by atomic force microscopy (AFM). Dynamic secondary ion mass spectrometry (SIMS) was used to study microphase segregation of the polymer films. A series of two-dimensional (2D) images of the films were acquired during sample sputtering. A reconstruction of the sample three-dimensional (3D) structure from 2D data was performed. Spatial distributions of H, D, C, O, and higher mass fragments revealed microphases with dimensions on the order of a few microns. We describe the method that corrects height distortion to 3D SIMS images. After sputtering, AFM is used to produce a topographic image of the area analyzed by SIMS. The surface height variation array from SIMS data was compared with that observed by AFM. A limitation of the correction method is discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 661: Symposium KK – Filled & Nanocomposite Polymer Materials , 2000 , KK6.2
Copyright
Copyright © Materials Research Society 2001

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References

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