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Time-Resolved, Laser-Induced Phase Transformation in Aluminum

Published online by Cambridge University Press:  25 February 2011

S. Williamson ,
G. Mourou  and
J.C.M. Li
S. Williamson
Affiliation:
Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, NY14623-1299 :River
G. Mourou
Affiliation:
Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, NY14623-1299 :River
J.C.M. Li
Affiliation:
Department of Mechnical Engineering, University of Rochester, 250 East River Road, Rochester, NY14623-129950 EAST
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Abstract

The technique of picosecond electron diffraction is used to time resolve the laser-induced melting of thin aluminum films. It is observed that under rapid heating conditions, the long range order of the lattice subsists for lattice temperatures well above the equilibrium point, indicative of superheating. This superheating can be verified by directly measuring the lattice temperature. The collapse time of the long range order is measured and found to vary from 20 ps to several nanoseconds according to the degree of superheating. Two interpretations of the delayed melting are offered, based on the conventional nucleation and point defect theories. While the nucleation theory provides an initial nucleus size and concentration for melting to occur, the point defect theory offers a possible explanation for how the nuclei are originally formed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 35: Symposium A – Energy Beam-Solid Interactions and Transient Thermal Processing/1984 , 1984 , 87
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

[1] Yamada, M., Kotani, H., Yamazaki, K., Yamamoto, K., and Abe, K., J. Phys. Soc. Japan, 49, 1299 (1980).Google Scholar
[2] Galvin, G.J., Thompson, M.O., Mayer, J.W., Hamond, R.B., Paulter, N. and Peercy, P.S., Phys. Rev. Lett., 48, 33 (1982).Google Scholar
[3] Auston, D.H., Surko, C.M., Venkatesan, T.N.C., Slusher, R.E., and Golovchenko, J.A., Appl. Phys. Lett., 33, 437 (1978).Google Scholar
[4] Shank, C.V., Yen, R., and Hirlimann, C., Phys. Rev. Lett., 50, 454 (1983).Google Scholar
[5] Liu, J.M., Kurz, H., and Bloembergen, N., Appl. Phys. Lett., 41, 643 (1982).Google Scholar
[6] Lo, H.W. and Compaan, A., Phys. Rev. Lett., 44, 1604 (1980).Google Scholar
[7] Pospieszczyk, A, Harith, M.A., and Stritzker, B., J. Appl. Phys., 54, 3176 (1983).Google Scholar
[8] Larson, B.C., White, C.W., Noggle, T.S., and Mills, D., Phys. Rev. Lett., 48, 337 (1982).Google Scholar
[9] Becker, R.S., Higashi, G.S., and Golovchenko, J.A., Phys. Rev. Lett., 52, 307 (1984).Google Scholar
[10] Epstein, H.M., Schwerzel, R.E., Mallozzi, P.J., and Campbell, B.E., J. Am. Chem. Soc., 105, 1466 (1983).Google Scholar
[11] Shank, C.V., Yen, R., and Hirliman, C., Phys. Rev. Lett., 51, 900 (1983).Google Scholar
[12] Mourou, G. and Williamson, S., Appl. Phys. Lett., 41, 44 (1982).Google Scholar
[13] Bradley, D.J. and Sibbett, W., Appl. Phys. Lett., 27, 382 (1975).Google Scholar
[14] Mourou, G. and Knox, W., Appl. Phys. Lett., 36, 623 (1980).Google Scholar
[15] Williamson, S, Mourou, G., and Letzring, S., Proc. 15th Int. Cong. on High Speed Photography, Vol. 348 (I), 197 (1983).Google Scholar
[16] Simmons, R.O. and Balluffi, R.W., Phys. Rev., 117, 52 (1960).Google Scholar