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Three Dimensional Observation of Flux Pinning Centers in Dy-doped YBa2Cu3O7-x Coated Superconductors by STEM Tomography

Published online by Cambridge University Press:  01 February 2011

Volkan Ortalan
Affiliation:
[email protected], University of California, Davis, Chemical Engineering and Materials Science, 1 Shields Aenue, Davis, CA, 95616, United States, 530 754 8012
Miriam Herrera
Affiliation:
[email protected], University of California-Davis, Chemical Engineering and Materials Science Department, One Shields Avenue, Davis, CA, 95616, United States
David G. Morgan
Affiliation:
[email protected], University of California-Davis, Chemical Engineering and Materials Science Department, One Shields Avenue, Davis, CA, 95616, United States
Martin W. Rupich
Affiliation:
[email protected], American Superconductor Corporation, Westborough, MA, 01581, United States
Nigel D. Browning
Affiliation:
[email protected], University of California-Davis, Chemical Engineering and Materials Science Department, One Shields Avenue, Davis, CA, 95616, United States
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Abstract

The spatial distribution of flux pinning centers in YBa2Cu3O7 (YBCO) coated conductors significantly affects the conductive properties. Nanoparticles acting as pinning centers can be intentionally introduced into the structure by chemical doping. In this study, a Dy-doped YBa2Cu3O7-x coated superconductor was investigated and the particle composition was found to be as (YsDy1-s)2Cu2O5 with s ∼0.6. A tomographic tilt series was acquired using a scanning transmission electron microscope (STEM) to determine the 3-D distribution of nanoparticles. In the investigated sample area, 71 particles were located with a particle size distribution ranging between 13 and 135 nm. The distribution uniformity and size of the particles appeared to be dependent on the grain boundary network structure. Large particles were observed to be located on grain boundaries indicating that fast grain boundary diffusion may determine the particle size.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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