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Thermoelectric Power Devices Based on InN Thin Films

Published online by Cambridge University Press:  26 February 2011

Takayuki Matsumoto
Affiliation:
[email protected], Kanagawa University, Engineering, 3-27-1 Rokkakubashi Kanagawa-ku Yokohama, Yokohama, 221-8686, Japan
Shigeo Yamaguchi
Affiliation:
[email protected], Kanagawa University, Yokohama, 221-8686, Japan
Atsushi Yamamoto
Affiliation:
[email protected], AIST, Tsukuba, 305-8568, Japan
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Abstract

We have studied the temperature dependence of thermoelectric properties of amorphous InN thin films prepared by reactive radio-frequency sputtering. We fabricated 60-pair and 120-pair InN-chromel films, which were deposited on polyimide films. For the 120-pair device, the maximum open output voltage and the maximum output power were 210 mV and 65 nW, respectively, at temperature difference of 168 K.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Yamaguchi, S., Iwamura, Y., and Yamamoto, A., Appl. Phys. Lett. 82, 2065 (2003).Google Scholar
2. Yamaguchi, S., Izaki, R., Yamagiwa, K., Taki, K., Iwamura, Y., and Yamamoto, A., Appl. Phys. Lett. 83, 5398 (2003).Google Scholar
3. Izaki, R., Kaiwa, N., Hoshino, M., and Yaginuma, T., Yamaguchi, S., and Yamamoto, A., Appl. Phys. Lett. 87, 243508 (2005).Google Scholar
4. Fritzshe, H. and Pollak, M., ed., HOPPING AND RELATED PHENOMENA, in Advances in Disordered Semiconductors-vol. 2, World Scientific Publishing, Singapore, 1990.Google Scholar