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Thermoelectric Measurements of Ni Nanojunctions

Published online by Cambridge University Press:  08 March 2013

See Kei Lee ,
Ryo Yamada  and
Hirokazu Tada
See Kei Lee
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka, Japan.
Ryo Yamada
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka, Japan.
Hirokazu Tada
Affiliation:
Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka, Japan.
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Abstract

We investigated the thermoelectric voltage (TEV) of atomic contacts of nickel (Ni) by using a scanning tunneling microscope. The TEV of nanoscale junctions show fluctuation in stepwise manner. Histogram analysis of TEV observed in the Ni point contact with the conductance of 1.2 G0 (G0 = 2e2/h is the quantum of charge conductance) revealed multiple voltage peaks at larger and smaller values observed at conductance of 2.5 G0, which showed a single sharp voltage peak. Fluctuation observed in our results suggest that there is transition of the transport channel distribution caused by the thermal motion of Ni atoms.

Keywords

thermoelectricnanoscalenanostructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1490: Symposium B – Thermoelectric Materials Research and Device Development for Power Conversion and Refrigeration , 2013 , pp. 139 - 144
Copyright
Copyright © Materials Research Society 2013 

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References

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