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Thermodynamics and Kinetics of Oxidation of Pure Indium Solders

Published online by Cambridge University Press:  26 February 2011

Harry Schoeller ,
Jongman Kim ,
Seungbae Park  and
Junghyun Cho
Harry Schoeller
Affiliation:
[email protected], SUNY at Binghamton, Mechanical Engineering, Vestal Pkwy East, Binghamton, NY, 13902-6000, United States
Jongman Kim
Affiliation:
[email protected], SUNY at Binghamton, Mechanical Engineering, Vestal Pkwy East, Binghamton, NY, 13902-6000, United States
Seungbae Park
Affiliation:
[email protected], SUNY at Binghamton, Mechanical Engineering, Vestal Pkwy East, Binghamton, NY, 13902-6000, United States
Junghyun Cho
Affiliation:
[email protected], SUNY at Binghamton, Mechanical Engineering, Vestal Pkwy East, Binghamton, NY, 13902-6000, United States
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Abstract

MicroElectroMechanical System (MEMS) devices often require low-temperature, fluxless soldering techniques due to their high temperature sensitivity and performance requirements of the components. While seeking the development of a soldering technology using pure indium, the major focus of this study is to assess the thermodynamics and kinetics of indium oxidation at various solder reflow environments that will ultimately provide a processing window for solder reflow and surface oxide cleaning. With a glove box employed to generate reducing environments, oxygen, moisture, and hydrogen contents were varied to examine their effects on oxidation and reduction behavior of indium. We also explored oxidation mechanisms at different regimes of temperature and time. In particular, electron transport from indium to indium oxide is shown to be the rate controlling mechanism under specific oxidizing conditions. For accurate thickness measurements, a spectroscopic ellipsometer was employed. In addition, the effect of indium oxidation on solder joint reliability was observed via wetting angle and interfacial shear strength measurements.

Keywords

oxidationsolderingpackaging
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 968: Symposium V – Advanced Electronic Packaging , 2006 , 0968-V03-07
Copyright
Copyright © Materials Research Society 2007

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References

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