Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-27T02:42:09.421Z Has data issue: false hasContentIssue false

Theoretical Investigation of Formation of (n-n+)-Junction in Ion-Implanted Crystalline Matrix

Published online by Cambridge University Press:  01 February 2011

R. Peleshchak
Affiliation:
State Pedagogical University, 24 Franko str., 82100 Drohobych, Ukraine
O. Kuzyk
Affiliation:
State Pedagogical University, 24 Franko str., 82100 Drohobych, Ukraine
H. Khlyap
Affiliation:
University of Technology, E.-Schroedinger str. 56, D-67663 Kaiserslautern, Germany, and 8tate Pedagogical University, 24 Franko str., 82100 Drohobych, Ukraine
Get access

Abstract

The paper reports results of theoretical calculations of the redistribution of electrons and electrostatic potential in the implanted crystalline matrix (100)-GaAs+Si(Ar) due to electrondeformation effects. The model requires a self-consistent solution of the set of following equations: 1)the time-independent Schroedinger equation; 2) the equation of mechanical equilibrium: 3) the Poisson equation for determining electrostatic potential distribution; 4) the equation for calculation of the electron concentration, and 5) the equation for the chemical potential calculation in the implanted system. The most important result is: it is shown that in the elastic region of the implanted matrix n-n+-junction is formed. Current-voltage characteristics of the junction are numerically simulated.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Ion Implantation and Beam Processing, ed. by Williams, J.S. and Poate, J.M.. Academic Press, New York, 1984. — 390 p.Google Scholar
2 Baskin, E., Reznik, A., Saada, D., Adler, J. and Kalish, R.. Phys. Rev. B64 224110 (2001)/Google Scholar
3 Briehl, B. and Urbassek, H.M.. J. Appl. Phys. 93 4420 (2003).Google Scholar
4 Klad'ko, V.P., Datsenko, L.I., Maksimenko, Z.V., Klad'ko, I.V. Ukrainian Phys. Journ. 46 749 (2001).Google Scholar
5 Peleshchak, R.M., Ukrainian Phys. Journ. 44 1417 (1999).Google Scholar
6 Fal'ko, G.L., Shparko, S.G. Ukrainian Phys. Journ. 40 1871 (1989).Google Scholar
7 Titov, A.I. Proceedings of the Academy of Sciences of the USSR, IAE, 3774/11 (1983).Google Scholar
8 Walle, C. G. Phys. Rev. B39 1871 (1989).Google Scholar
9 Sze, S. Physics of Semiconductor Devises, Wiley & Sons, New York, 1981.Google Scholar