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Theoretical Calculations of the Nonlinear Dielectric Function of Inhomogeneous thin Films

Published online by Cambridge University Press:  25 February 2011

Steven M. Risser  and
Kim F. Ferris
Steven M. Risser
Affiliation:
Pacific Northwest Laboratories, Materials and Chemical Sciences Center, Richland, WA
Kim F. Ferris
Affiliation:
Pacific Northwest Laboratories, Materials and Chemical Sciences Center, Richland, WA
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Abstract

The dielectric function of inhomogeneous materials is composed of linear and nonlinear responses which are sensitive to the film microstructure as well as the intrinsic properties of the materials. We have developed a method to self-consistently determine the linear and non-linear contributions to the dielectric function of films with random microstructure. This method is based upon a numerical solution of the general electrostatic equations and is applicable to arbitrary shapes and orientations of model defects. This method provides near exact solutions to the linear response of the dielectric function. We have shown that the nonlinear part of the dielectric function is extremely sensitive to the void shape and void fraction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 173: Symposium Q – Advanced Organic Solid State Materials , 1989 , 687
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

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