Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-20T07:03:40.286Z Has data issue: false hasContentIssue false
  • English
  • Français

Template-free, low temperature synthesis of binary and ternary metal oxide nanostructures

Published online by Cambridge University Press:  03 March 2011

Sanjaya Brahma ,
Pallavi Arod  and
S.A. Shivashankar
Sanjaya Brahma
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore-560012, India
Pallavi Arod
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore-560012, India
S.A. Shivashankar
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore-560012, India
Get access

Abstract

We report synthesis of some binary and ternary metal oxide nanostructures using microwave irradiation-assisted chemical synthesis, either in the presence or absence of a surfactant/structure directing agent. The method is simple, inexpensive, and yields nanoparticles of desired metal oxides in minutes, and requires no conventional templating. Nanoparticles of some functionally advanced binary/ternary metal oxides (MnO2, ZnO, CuO, ZnMn2O4 etc) have been synthesized using metal acetylacetonates as the starting precursor material and microwave as the source of energy, in a process developed in detail in our laboratory. The nanoparticle size varies from 7-50 nm. Emphasis has been placed on the synthesis of ZnO nanostructures, particularly ZnO nanoshells, which do not require any surfactant/structure-directing agent for synthesis. There is a systematic variation in the morphology of the ZnO nanostructures with variation of process parameters, such as microwave power, microwave irradiation time, type of solvents, surfactants/structure-directing agents and its type and concentration. The as-prepared powder sample may either need a very brief exposure to heat to remove the surfactant or no post-synthesis processing, and is found to be well-crystallised. Determination of their crystallinity, actual shape, and orientation was made using X-ray diffraction, scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

Keywords

nanostructuremicrowave heatingoxide
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1292: Symposium K – Oxide Nanoelectronics , 2011 , mrsf10-1292-k12-03
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Gulley-Stahl, H. J., Schmidt, W. L., Bullen, H. A., J. Mater. Sci. 43 (2008) 7066.Google Scholar
2. Zheng, Y., Cheng, Y., Wang, Y., Bao, F., Zhou, L., Wei, X., Zhang, Y., Zheng, Q., J. Phys. Chem. B. 110 (2006) 3093.Google Scholar
3. Wang, Y., Guo, M., Zhang, M., Wang, X., Scr. Mater. 61 (2009) 234.Google Scholar
4. Zhou, F., Ni, X., Zhang, Y., Zheng, H., J. Coll. Interface Sci. 307 (2007) 135.Google Scholar
5. Özgür, Ü., Alivov, Y. I., Liu, C., Teke, A., Reshchikov, M. A., Doğan, S., Avrutin, V., Cho, S. -J., Morkoç, H., J. Appl. Phys. 98 (2005) 041301.Google Scholar
6. Wang, Z. L., J. Phys.: Condens. Matter, 16, 2004, R829.Google Scholar
7. Mater. Res. Soc. Sym. Proc. 2007 Fall Proceedings, Volumes 1024E - 1065E Symposium L (Volume 1035E) Zinc Oxide and Related Materials (References therein).Google Scholar
8. Mater. Res. Soc. Sym. Proc. 2006 Fall Proceedings, Volumes 947 – 988, Symposium K (Volume 957) Zinc Oxide and Related Materials (References therein).Google Scholar
9. Bilecka, I., Djerdj, I., Niederberger, M., Chem. Commun., 7, (2008) 886–888.Google Scholar
10. Brahma, S., Shivashankar, S.A., Mater. Res. Soc. Symp. Proc., 1174, (2009) 75–80.Google Scholar
11. Brahma, S., Rao, K. J., Shivashankar, S., Bull. Mater. Sci. 33, (2010) 89–95.Google Scholar
12. Jcpds - 00-001-0799 ((International Center for Diffraction Data).Google Scholar
13. Jcpds - 01–1117 (International Center for Diffraction Data).Google Scholar
14. JCPDS –; 05–0664(International Center for Diffraction Data).Google Scholar