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TEM Studies of Alloy Clustering in InAlAs Strained Layers
Published online by Cambridge University Press: 26 February 2011
Abstract
Transmission electron microscopy studies have been performed to characterise InxAl1−xAS layers grown by Molecular Beam Epitaxy on (100) InP substrates. The first observations of compositional nonuniformities in strained InAlAs layers are reported. The coarse quasiperiodic structure present in each sample has been found to be dependent upon the growth parameters and the sample characteristics such as strain, thickness and x value.
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- Copyright © Materials Research Society 1992
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