Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-25T17:33:21.410Z Has data issue: false hasContentIssue false

Synthesis, Structural Characterization, and Optical Spectroscopy of Close Packed CdSE Nanocrystallites

Published online by Cambridge University Press:  28 February 2011

C. R. Kagan
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139
C. B. Murray
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139
M. G. Bawendi
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139
Get access

Abstract

We describe a method to synthesize optical quality thin and thick films of close packed CdSe nanocrystallites (quantum dots). The average dot size is tunable from ∼12-150 Å in diameter with ∼3.5% rms size distribution. The identity of each particle and the high monodispersity of the sample are maintained in the films as revealed by small-angle x-ray scattering, transmission electron microscopy, and optical spectroscopy. We use small-angle x-ray diffraction patterns to obtain form factors for the individual dots and to generate radial distribution functions for the densely packed films. We observe the random close packing of dots in the solid state using transmission electron microscopy. Comparing optical spectra of particles close packed in a film with those of nanocrystallites dispersed in alkanes reveals similar optical resonances in absorption while the emission lineshape is modified and its position is red shifted. Differences in film emission are consistent with electronic energy transfer between close packed dots within the inhomogeneous distribution of the sample.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Efros, AL L. and Efros, A. L., Sov. Phys. Semicond. 16,772 (1982); L. E. Brus, J. Chem. Phys. 80, 4403 (1984).Google Scholar
2 Murray, C. B., Norris, D. J., and Bawendi, M. G., J. Am. Chem Soc. 115,8706 (1993).Google Scholar
3 Vossmeyer, T. et al. , J. Phys. Chem. 98 7665 (1994).Google Scholar
4 Norris, D. J., Sacra, A., Murray, C. B., and Bawendi, M. G., Phys. Rev. Lett. 72,2612 (1994).Google Scholar
5 Brus, L. E., AppL Phys. A 53,465 (1991).Google Scholar
6 Takaghara, T., Optoelect. Dev. Tech. 8,545 (1993).Google Scholar
7 Heitmann, D. and Kotthaus, J. P., Physics Today 46,56 (1993).Google Scholar
8 Guinier, A., X-ray Diffraction. (Dover Publications, Inc., New York, 1994), p. 319.Google Scholar
9 Klug, H. P. and Alexander, L. E., X-rav Diffraction Procedures (Wiley, New York, 1954), p. 586.Google Scholar
10 Kingery, W. D. et al. , Introduction to Ceramics. 2nd Ed (Wiley, New York, 1960), p. 769.Google Scholar
11 Förster, Th., in Comparative Effects of Radiation, edited by Burton, M., Kirby-Smith, J. S., and Magee, J. L., (Wiley, New York, 1960), p. 301.Google Scholar
12 Spanhel, L. and Anderson, M. A., J. Am. Chem Soc. 112,2278 (1990).Google Scholar