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Synchrotron X-ray Absorption Spectroscopy Studies of Pt/Si Systems

Published online by Cambridge University Press:  10 February 2011

I. Coulthard ,
S. J. Naftel  and
T. K. Shama
I. Coulthard
Affiliation:
Department of Chemistry, University of Western Ontario, London, Canada.
S. J. Naftel
Affiliation:
Department of Chemistry, University of Western Ontario, London, Canada.
T. K. Shama
Affiliation:
Department of Chemistry, University of Western Ontario, London, Canada.
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Abstract

Platinum was deposited onto porous silicon by a reductive deposition technique utilizing the inherent reducing power of porous silicon. The resulting deposits were studied by X-ray Absorption Near Edge Structure (XANES) at the Si-K, Pt-M3, 2, and Pt-L 3 ,2 edges. Samples of varying deposition concentrations were studied and were compared with untreated porous silicon and platinum silicides to determine the nature of the deposits and their effect upon the porous silicon substrate itself.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 291
Copyright
Copyright © Materials Research Society 1998

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References

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