Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-23T05:41:50.363Z Has data issue: false hasContentIssue false
  • English
  • Français

Synchrotron Photoluminescence Spectroscopy of Boron Nitride Nanotubes with Different Metal Impurities

Published online by Cambridge University Press:  31 January 2011

Jun Yu ,
Ying Ian Chen ,
Luhua Li ,
Bing-ming Cheng  and
Dehong Yu
Jun Yu
Affiliation:
[email protected], The Australian National University, Electronic Materials and Engineering, Canberra, Australian Capital Territory, Australia
Ying Ian Chen
Affiliation:
[email protected], Deakin University, Institute for Technology Research and Innovation, Geelong Technology Precinct, Geelong, Victoria, 3217, Australia
Luhua Li
Affiliation:
[email protected], Deakin University, Australia, Research and Innovation, Geelong, Victoria, Australia
Bing-ming Cheng
Affiliation:
[email protected], National Synchrotron Radiation Research Centre, Hsinchu, Taiwan, Taiwan, Taiwan, Province of China
Dehong Yu
Affiliation:
[email protected], Australian Nuclear Science and Technology Organization, Bragg Institute, Sydney, New South Wales, Australia
Get access

Abstract

In this paper, the impurity influences of BNNTs on photoluminescence (PL) analysis have been investigated systematically. Similar PL spectra were obtained from bulk disk of the cold-pressed BNNTs and dispersed individual BNNTs deposited on CaF2 substrate. Metal impurities such as Fe and Au do not affect PL emissions of the BNNTs strongly possibly because Au doping creates sever structural damages but do not change the electronic structure.

Keywords

nanostructurereactive ball millingnitride
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1204: Symposium K – Nanotubes and Related Nanostructures-2009 , 2009 , 1204-K08-02
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Watanabe, K., Taniguchi, T., and Kanda, H., Nat. Mater. 3, 404 (2004).Google Scholar
2. Lauret, J. S., Arenal, R., Ducastelle, F., Loiseau, A., Cau, M., Attal-Tretout, B., Rosencher, E., and Goux-Capes, L., Phys. Rev. Lett. 94, 037405 (2005).10.1103/PhysRevLett.94.037405Google Scholar
3. Chen, H., Chen, Y., Li, C. P., Zhang, H. Z., Williams, J. S., Liu, Y., Liu, Z. W., and Ringer, S. P., Adv. Mater. 19, 1845 (2007).Google Scholar
4. Chen, H., Chen, Y., Liu, Y., Xu, C. N., and Williams, J. S., Opt. Mater. 29, 1295 (2007).Google Scholar
5. Yu, J., Yu, D., Chen, Y., Chen, H., Lin, M. Y., Cheng, B. M., Li, J. and Duan, W., Chem. Phys. Lett. 476, 240 (2009)Google Scholar
6. Berzina, B., Trinkler, L., Korsak, V., Krutohvostov, R., Carroll, D. L., Ucer, K. B., and Williams, R. T., Phys. Status Solidi B 243, 3840 (2006).Google Scholar
7. Silly, M. G., Jaffrennou, P., Barjon, J., Lauret, J. S., Ducastelle, F., Loiseau, A., Obraztsova, E., Attal-Tretout, B. and Rosencher, E., Phys. Rev. B 75, 085205 (2007).10.1103/PhysRevB.75.085205Google Scholar
8. Lefebvre, J., Homma, Y., and Finnie, P., Phys. Rev. Lett. 90, 217401 (2003).Google Scholar
9. Lefebvre, J., Fraser, J. M., Homma, Y., and Finnie, P., Appl. Phys. a-Mater. 78, 1107 (2004).10.1007/s00339-003-2460-6Google Scholar
10. Chen, Y., J. D. Fitz Gerald, Williams, J. S., and Bulcock, S., Chem. Phys. Lett. 299, 260 (1999).10.1016/S0009-2614(98)01252-4Google Scholar
11. Chen, Y., Chadderton, L. T., FitzGerald, J., and Williams, J. S., Appl. Phys. Lett. 74, 2960 (1999).Google Scholar
12. Yu, J., Chen, Y., Wuhrer, R., Liu, Z. W., and Ringer, S. P., Chem. Mater. 17, 5172 (2005).Google Scholar
13. Chen, Y., Halstead, T., and Williams, J. S., Mat. Sci. Eng. a-Struct. 206, 24 (1996).Google Scholar
14. Chen, Y., Chadderton, L. T., Williams, J. S., and Gerald, J. D. Fitz, Mater. Sci. Forum 343–3, 63 (2000).Google Scholar
15. Chen, Y., Conway, M., Williams, J. S., and Zou, J., J. Mater. Res. 17, 1896 (2002).10.1557/JMR.2002.0281Google Scholar
16. Fitzgerald, J. D., Chen, Y., and Conway, M. J., Appl. Phys. B-Lasers O 76, 107 (2003).Google Scholar
17. Jaffrennou, P., Donatini, F., Barjon, J., Lauret, J. S., Maguer, A., Attal-Tretout, B., Ducastelle, F., and Loiseau, A., Chem. Phys. Lett. 442, 372 (2007).Google Scholar
18. Yao, B., Liu, L., Su, W. H., Shen, Z. X., Liu, L., Sun, W. X., and Ding, J., J. Appl. Phys. 96, 1947 (2004).Google Scholar
19. Chen, Y. J., Fu, L., Chen, Y., Zou, J., Li, J., and Duan, W. H., NANO 2, 367 (2007).Google Scholar