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Survey of Modern RF and Microwave Test Instruments

Published online by Cambridge University Press:  15 February 2011

Doug Rytting  and
Carla Slater
Doug Rytting
Affiliation:
Hewlett-Packard Company, 1400 Fountaingrove Parkway, Santa Rosa, CA 95403, USA
Carla Slater
Affiliation:
Hewlett-Packard Company, 1400 Fountaingrove Parkway, Santa Rosa, CA 95403, USA
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Extract

This survey paper introduces the basics of RF and microwave device (or component) testing. It establishes a foundation of concepts and terminology.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 347: Symposium O – Microwave Processing of Materials IV , 1994 , 415
Copyright
Copyright © Materials Research Society 1994

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