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Surface Modifications on Charge-Transfer Complexes Using Scanning Probe Microscopy

Published online by Cambridge University Press:  21 February 2011

Shoji Yamaguchi ,
Carlos A. Valenzuela  and
Richard S. Potember
Shoji Yamaguchi
Affiliation:
Mitsubishi Petrochemical Co., Ltd. Tsukuba Research Center, Advanced Materials Laboratory, 8-3-1 Chuo, Ami, Inashiki, Ibaraki 300-03, Japan
Carlos A. Valenzuela
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
Richard S. Potember
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
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Abstract

We are exploring high density information storage systems based on organometallic materials. Silver and copper salts of tetracyanoquinodimethane (TCNQ) and its derivatives exhibit an electrical and optical field induced reversible switching phenomenon. We have demonstrated a field-induced, charge-transfer reaction driven by the electric field at the STM tip when the field generated by the STM exceeds the switching threshold of the organic charge-transfer complex. The phase transition induced by the STM tip appears as nanometer-sized domains on the metal-TCNQ and derivatives surface. We also have shown this phase transition occur by means of optical laser irradiation. This paper discusses our plans to combine our research results in optical switching with the scanning near-field optical microscope (NSOM) to develop a very high density optical memory system. In order toassess the feasibility of this, we performed a series of experiments aimed at determining the limitations of information storage using this class of organic charge transfer complexes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 311: Symposium O – Phase Transformations in Thin Films–Thermodynamics and Kinetics , 1993 , 391
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

[1] Thomson, D. J., J. Microscopy (Oxford), 152, 627 (1988)Google Scholar
[2] Yamaguchi, S., Viands, C. A., and Potember, R. S., J. Vac. Sci. Technol., 29, (1991) 1129 CrossRefGoogle Scholar
[3] Matsumoto, M., Nishio, Y., Tachikbana, H., Nakanmura, T., Kawabata, Y., H. Samura and Nagamura, T., Chem. Lett., 1021 (1991)Google Scholar
[4] Potember, R. S., Poehler, T. O., Rappa, A., Cowan, D. O. and Bloch, A. N., Syn. Metals, 4, 371 (1982)Google Scholar
[5] Hoffman, R. C. and Potember, R. S., Appl. Opt., 28, 1417 (1989)Google Scholar
[6] Kamitsos, E. I., Tzinis, C. H., and Risen, W. M. Jr., Solid State Commun. 42, 561 (1982)Google Scholar