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Surface Electronic Function Properties Characterization from Defect Heterogeneity Dominated Specular/Glancing/Grazing Versus Bulk Transmission Small-Angle-Scattering(SAS) Diffraction-Pattern via the Static Synergetics Algorithm/Exprimental Model

Published online by Cambridge University Press:  22 February 2011

Edward Siegel
Edward Siegel*
Affiliation:
Static Synergetics Research Ltd., 183-14th Avenue,San Franoisoo,CA.94118
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Abstract

The ability of Static Synergetios,the universal,reversible,scalable mathematical algorithm/(used as an) experimental model, connecting external radiation small-angle-scattering diffraction-pattern/static structure factor SSAS (k),dominated by defect heterogeneities/clumps/clusters,to electronic (magniic,mechanical) complex,frequency-dependent electrical,dielectric, noise,optical…Function properties,can be enhanced by utilizing a comparison/difference of bulk transmission versus surface specular/glancing/grazing incidence small-angle-scattering diffraction-patterns.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 48: Symposium E – Applied Materials Characterization , 1985 , 63
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. Haken, H.,Series in Svnergetics, Springer-Verlag(1970's–1980's)Google Scholar
2. Siegel, E.,J.Noncryst.Sol. 40,453(1980) ;Intl.Conf.Lattice Dynamios,Paris(1977)CrossRefGoogle Scholar
3. Ngai, K.L.,Comm.S.S.Phys. 9,4,127(1979) ;9,5,141(1980) ;N.R.L.Rept.#3917(1979)Google Scholar
4. Jonscher, A.K.,Contemp.Phys. 24,1,75(19835 ;in Physics of Dielectric Solids, I.O.P.#58,I.O.P.(1979);Chelsea College Dielectrics Group Handbook(1979)Google Scholar
5. Siegel, E.,Proc.Electrochem.Soc. 83,8,497(1983) ;Intl.Conf.Lasers & E.O. (1983)Google Scholar
6. Dutta, P. and Horn, P.,Rev.Mod.Phys. 53,3,497(1981)CrossRefGoogle Scholar
7. Hooge, F.N.,Phys.Lett.A,29,139(1969) ;P.HandelPhys.Rev.A22,2 745(1980)CrossRefGoogle Scholar
8. Kolbesen, B.O. and Strunk, M.,solid State Devices(1980),I.O.P.#57,I.O.P.(1981)Google Scholar