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Study of ZnTe:Cu/Metal Interfaces in CdS/CdTe Phovoltaic Solar Cells
Published online by Cambridge University Press: 01 February 2011
Abstract
The present model for current transport at the CdTe/p-ZnTe:Cu/metal back contact assumes that the CdTe and ZnTe valence bands align, while current transport at a highly doped ZnTe and a metal interface proceeds by tunneling. To test part of this model, we have investigated the electrical and material properties of CdS/CdTe devices where the outer metal is either Ti or Ni. Our results show that differences in device series resistance are not linked simply to metal/ZnTe:Cu interfacial contact resistance, but that metallization-induced diffusion remains a more likely cause of significant performance distinctions.
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- Copyright © Materials Research Society 2004
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