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Study of the Local Atomic order in Si/C/N Nanopowders by X-ray Photoelectron Spectroscopy

Published online by Cambridge University Press:  10 February 2011

A. Gheorghiu-de la Rocque ,
G. Dufour ,
P. A. Bonnefont ,
C. Sénémaud  and
M. Cauchetier
A. Gheorghiu-de la Rocque
Affiliation:
Laboratoire de Chimie-Physique, URA CNRS 176, Université Pierre et Marie Curie 11 rue Pierre et Marie Curie, F-75231 Paris Cedex 05
G. Dufour
Affiliation:
Laboratoire de Chimie-Physique, URA CNRS 176, Université Pierre et Marie Curie 11 rue Pierre et Marie Curie, F-75231 Paris Cedex 05
P. A. Bonnefont
Affiliation:
Laboratoire de Chimie-Physique, URA CNRS 176, Université Pierre et Marie Curie 11 rue Pierre et Marie Curie, F-75231 Paris Cedex 05
C. Sénémaud
Affiliation:
Laboratoire de Chimie-Physique, URA CNRS 176, Université Pierre et Marie Curie 11 rue Pierre et Marie Curie, F-75231 Paris Cedex 05
M. Cauchetier
Affiliation:
CEA Saclay, Service des Photons, Atomes et Molécules F-91191 Gif Sur Yvette Cedex
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Abstract

A study by X-ray photoelectron spectroscopy (XPS) of the local atomic environment in laser-synthetized Si/C/N nanopowders is presented. The Si 2p, C Is, and N 1s core levels as well as the valence band distribution are investigated. The attention is focused on samples with C/N atomic ratio around 0.6 which exhibit interesting properties concerning annealing treatments. The presence of C-N bonds after 1500°C annealed samples is evidenced.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 501: Symposium FF – Surface Controlled Nanoscale Materials for High-Added… , 1997 , 115
Copyright
Copyright © Materials Research Society 1998

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References

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