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Study of the Local Atomic order in Si/C/N Nanopowders by X-ray Photoelectron Spectroscopy
Published online by Cambridge University Press: 10 February 2011
Abstract
A study by X-ray photoelectron spectroscopy (XPS) of the local atomic environment in laser-synthetized Si/C/N nanopowders is presented. The Si 2p, C Is, and N 1s core levels as well as the valence band distribution are investigated. The attention is focused on samples with C/N atomic ratio around 0.6 which exhibit interesting properties concerning annealing treatments. The presence of C-N bonds after 1500°C annealed samples is evidenced.
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- Copyright © Materials Research Society 1998