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Study of Ion Beam Mixing by x ray reflectometry

Published online by Cambridge University Press:  15 March 2011

D Simeone
Affiliation:
CEA/DEN/DANS/DMN/SRMA/LA2M-MFE, CEA-CNRS-ECP, CE Saclay, Gif sur Yvette, 91191, France CNRS/ECP/SPMS-MFE, CEA-CNRS-ECP, SPMS, ECP, Chatenay-Malabry, 92292, France
D Gosset
Affiliation:
CEA/DEN/DANS/DMN/SRMA/LA2M-MFE, CEA-CNRS-ECP, CE Saclay, Gif sur Yvette, 91191, France CNRS/ECP/SPMS-MFE, CEA-CNRS-ECP, SPMS, ECP, Chatenay-Malabry, 92292, France
L. Luneville
Affiliation:
CEA/DEN/DANS/DM2S/SERMA/LLPR-MFE, CEA-CNRS-ECP, CE Saclay, Gif sur Yvette, 91191, France CNRS/ECP/SPMS-MFE, CEA-CNRS-ECP, SPMS, ECP, Chatenay-Malabry, 92292, France
G Baldinozzi
Affiliation:
CEA/DEN/DANS/DMN/SRMA/LA2M-MFE, CEA-CNRS-ECP, CE Saclay, Gif sur Yvette, 91191, France CNRS/ECP/SPMS-MFE, CEA-CNRS-ECP, SPMS, ECP, Chatenay-Malabry, 92292, France
N Moncoffre
Affiliation:
Université de Lyon, Université Lyon 1, CNRS/IN2P3, UMR5822, Institut de Physique Nucléaire de Lyon (IPNL), 4 rue Enrico Fermi, F-69622 Villeurbanne cedex, France
C. Deranlot
Affiliation:
Unité Mixte de Physique CNRS/Thales, Campus de Polytechnique, 1 Avenue A. Fresnel, 91767 Palaiseau Cedex, France and Université Paris-Sud 11, 91405 Orsay, France
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Abstract

We present in this text a new experimental tool to study the mixing of atoms under irradiation. Based on physics of x ray diffraction, the specular reflectivy of x ray was used to estimate the Auto Correlation Function associated with the electron density gradient. The accuracy of the ACF is around 1 nanometer and does not evolve with the thickness of the probed layer. Thus, this point allows accurately measuring the broadening of the electron density gradient spreading induced by irradiation. Such an accurate profile extracted over a large range of fluences (about 3 decades) would lead to the determination of the functional dependence of this spreading with the fluence. This could allow pointing out the main mechanisms triggering the atomic mixing over large distances when atomic mixing occurring in thermal spikes is washed out.

Type
Articles
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Martin, G. and Bellon, P., Solid State Phys. 53–54, 1 (1997).Google Scholar
2. Bernas, H., Attane, J. P., Heinig, K. H., Halley, D., Ravelosona, D., Marty, A., Auric, P., Chappert, C., and Samson, Y., Phys. Rev. Lett. 91, 077203 (2003).Google Scholar
3. Cheng, Y., Mater. Sci. Rep. 5, 45 (1990)Google Scholar
4. Bolse, W., Mater. Sci. Eng. R. 12, 53 (1994).Google Scholar
5. Averback, R. and de la Rubia, T. D., Solid State Phys. 51, 281 (1997).Google Scholar
6. Smith, R., Jakas, M., Ashworth, D., Oven, B., and Bowyer, M., Atomic and Ion Collisions in Solids and at Surfaces: Theory, Simulation and Applications, Cambridge University Press, Cambridge, England, (1997).Google Scholar
7. Sigmund, P. and Gras-Marti, A., Nucl. Instrum. Methods 168, 389 (1980).Google Scholar
8. Sigmund, P. and Gras-Marti, A., Nucl. Instrum. Methods 182-183, 25 (1981).Google Scholar
9. Kacsich, T., Weber, Th., Bolse, W., and Lieb, K., Appl. Phys. A Mater. Sci. Process. 57, 187 (1993).Google Scholar
10. Besenbacher, F., Bøttiger, J., Nielsen, S., and Whitlow, H., Appl. Phys. A: Mater. Sci. Process. 29, 141 (1982).Google Scholar
11. Wang, Z. L., Westendorp, J. F. M., and Saris, F. W., Nucl. Instrum. Methods 209-210, 115 (1983).Google Scholar
12. Enrique, R. A. and Bellon, P., Phys. Rev. Lett. 84, 2885 (2000).Google Scholar
13. Krasnochtchekov, P., Averback, R. S., and Bellon, P., Phys. Rev.B 75, 144107 (2007)Google Scholar
14. Sickafus, K., Grimes, R., Valdez, J., Ishimaru, M., Li, J. M. F., and Hartmann, T., Science 289, 748 (2000).Google Scholar
15. Simeone, D. and Luneville, L., Phys Rev E 81, 021115 (2010)Google Scholar
16. Daillant, J. and Gibaud, A., X ray and neutron reflectivity: principles and applications, Springer 1999.Google Scholar