Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-23T10:55:50.385Z Has data issue: false hasContentIssue false
  • English
  • Français

Study of Chromium Impurities in SrTiO3 by Photo-Electron Paramagnetic Resonance Spectroscopy

Published online by Cambridge University Press:  01 February 2011

Jamiyanaa Dashdorj  and
Mary Ellen Zvanut
Jamiyanaa Dashdorj
Affiliation:
[email protected], University of Alabama at Birmingham, Physics Department, 1300 University Boulevard, Birmingam, AL, 35294, United States, 205-975-8078, 205-934-8042
Mary Ellen Zvanut
Affiliation:
[email protected], University of Alabama at Birmingham, Physics Department, 1300 University Boulevard, Birmingam, AL, 35294, United States
Get access

Abstract

Chromium impurities in SrTiO3 grown by Verneuil and Float-zone methods were investigated using photo-electron paramagnetic resonance spectroscopy. The samples are the substrates typically used for deposition of multifunctional and ferromagnetic films. A maximum optical cross section for Cr3+ of 2.6×10−18 cm2 is obtained from the time-dependent data, and steady state measurements suggest the presence of a defect level 2 eV from one of the band edges. The cross section is similar to that obtained from optical absorption studies of Cr3+ in semiconductors. The results produced here should be useful for those trying to interpret photoluminescence or similar optical characterization data.

Keywords

electron spin resonanceCrabsorption
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1034 , 2007 , 1034-K10-19
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Shimoyama, K., Kubo, K., Maeda, T., and Yamabe, K., J. Appl. Phys. 40, L463 (2001).Google Scholar
2. Xi, X. X, Doughty, C., Walkenhorst, A., Mao, S. N, Li, Qi and Venkatesan, T., Appl. Phys. Lett. 61, 2353 (1992).Google Scholar
3. Capizzi, M. and Frova, A., Phys. Rev. Lett. 25, 1298 (1970).Google Scholar
4. Kahn, A.H. and Leyendecker, A.J., Phys. Rev. 135, A1321 (1964).Google Scholar
5. Grabner, L., Phys. Rev. 177, 1315 (1969).Google Scholar
6. Hasegawa, T., Shiral, M. and Tanaka, K., J. Lumin. 87–89, 1217 (2000).Google Scholar
7. Muller, K.A. and Berlinger, W., J. Phys. C. Solid state physics 16, 6861 (1983).Google Scholar
8. Muller, K.A., Helv. Phys. Acta. 31, 173 (1958).Google Scholar
9. Faughnan, B.W., Phys. Rev. B4, 3623 (1971).Google Scholar
10. Morin, F.J. and Oliver, J.R., Phys. Rev. B8, 5847 (1973).Google Scholar
11. Basin, S.A., Bianchi, U., Bursian, V.E., Kaplyanskii, A.A., Kleemann, W., Sochava, L.S. and Vikhnin, V.S., SPIE 2706, 73 (1996).Google Scholar
12. Weil, J. A, Bolton, J. R, and Wertz, J.E., “Electron Paramagnetic Resonance”, John Wiley & Sons, Inc, N.Y., 1994.Google Scholar
13. Kirkpatrick, E.S., Muller, K.A., and Rubins, R.S., Phys. Rev. 135, A86 (1964).Google Scholar
14. Godlewski, M., J. Appl. Phys. 56 (10), 2901 (1984).Google Scholar
15. Godlewski, M., Review Article, Phys. Stat. Sol. A 90, 11 (1985).Google Scholar