Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T02:19:13.586Z Has data issue: false hasContentIssue false
  • English
  • Français

Studies on Ultra-short Laser Micro Structuring

Published online by Cambridge University Press:  15 February 2011

I. Zergioti ,
D. G. Papazoglou ,
E. Gamaly ,
A. Rode  and
C. Fotakis
I. Zergioti
Affiliation:
Foundation of Research and Technology – Hellas, Institute of Electronic Structure and Laser, P. O. Box 1527, Heraklion 711 10, Greece
D. G. Papazoglou
Affiliation:
Foundation of Research and Technology – Hellas, Institute of Electronic Structure and Laser, P. O. Box 1527, Heraklion 711 10, Greece
E. Gamaly
Affiliation:
Research School of Physical Sciences and Engineering, The Australian National University, Canberra ACT 0200, Australia
A. Rode
Affiliation:
Research School of Physical Sciences and Engineering, The Australian National University, Canberra ACT 0200, Australia
C. Fotakis
Affiliation:
Foundation of Research and Technology – Hellas, Institute of Electronic Structure and Laser, P. O. Box 1527, Heraklion 711 10, Greece
Get access

Abstract

A comparative study of the effect of ultrashort (0.5 ps) and short (30 ns) pulses on Laser transfer of Cr is presented in this paper. The dynamics of the process was investigated by stroboscopic schlieren imaging for time delays up to 3 νsec following the laser irradiation pulse. In contrast to the ns laser the directionality of the ejected material is very high in the case of the sub-ps laser process. The narrow angular divergence (3°) of the sub-ps pulses permits the direct dynamic transfer of the material and opens up new application possibilities for the fabrication of high spatial resolution microstructures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 780: Symposium Y – Advanced Optical Processing of Materials , 2003 , Y4.2
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

references

1. Lee, Sandy, Tolbert, I.-Yin, William, A., Dlott, Dana D., Doxtader, Mark M., Foley, Diane M., Arnold, Dana R., Ellis, Ernest Imag, W. J.. Sci. Tech., 36 (2) (1992) 180.Google Scholar
2. Young, D., Auyeung, R.C.Y., Pique, A., Chrisey, D.B., Dlott, D., Appl. Phys. Lett., 78, 21, (2001) 3169.Google Scholar
3. Nakata, Y., Okada, T., Appl. Phys. A 69, (1999) 275.Google Scholar
4. Bullock, A. B., Bolton, P.R., J. Appl. Phys., 85, 1, (1999) 460.Google Scholar
5. Zergioti, I., Papazoglou, D. G., Karaiskou, A., Fotakis, C., Gamaly, E., Rode, A., Appl. Surf. Sci. 208-209, 177–180 (2003).Google Scholar
6. Hare, D. E., Franken, J., Dlott, D. D., J. Apll. Phys. 77, (1995) 5950.Google Scholar
7. Linde, D. von der, Sokolowski, K., Bialkowski, J., Appl. Surf. Sci. 109/110 (1997) 1.Google Scholar
8. Gamaly, E. G., Rode, A. V., Luther-Davies, B., J. Appl. Phys. 85, (1999) 4213.Google Scholar
9. Schoen, P.E., Campillo, A. J., Appl. Phys. Lett. 45, (1984) 1049.Google Scholar