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Studies of Cn1 Films Deposited by Ion-Beam-Assisted Laser Ablation of Graphite

Published online by Cambridge University Press:  21 February 2011

Zhong-Min Ren ,
Yuan-Cheng Du ,
Xia-Xing Xiong ,
Jia-Da Wu ,
Zhi-Feng Ying ,
Yuan-Xun Qiu  and
Fu-Ming Li
Zhong-Min Ren
Affiliation:
State key joint laboratory for material modification by laser, ion and electron beams, Fudan University, Department of Physics, Shanghai, 200433, China
Yuan-Cheng Du
Affiliation:
State key joint laboratory for material modification by laser, ion and electron beams, Fudan University, Department of Physics, Shanghai, 200433, China
Xia-Xing Xiong
Affiliation:
State key joint laboratory for material modification by laser, ion and electron beams, Fudan University, Department of Physics, Shanghai, 200433, China
Jia-Da Wu
Affiliation:
State key joint laboratory for material modification by laser, ion and electron beams, Fudan University, Department of Physics, Shanghai, 200433, China
Zhi-Feng Ying
Affiliation:
State key joint laboratory for material modification by laser, ion and electron beams, Fudan University, Department of Physics, Shanghai, 200433, China
Yuan-Xun Qiu
Affiliation:
State key joint laboratory for material modification by laser, ion and electron beams, Fudan University, Department of Physics, Shanghai, 200433, China
Fu-Ming Li
Affiliation:
State key joint laboratory for material modification by laser, ion and electron beams, Fudan University, Department of Physics, Shanghai, 200433, China
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Abstract

CN1 thin films have been synthesized by ion-beam-assisted laser ablation of graphite. Films with N-concentration of 45% are obtained, indicated by high energy backseattering spectrum (HEBS). Raman and X-ray photoelectron spectroscopy (XPS) data confirm the existence of carbon-nitrogen bonds. Polycrystallites beta-CjNi structure has been detected in the amorphous matrix of the films, as indicated by transmission electron microscopy (TEM) and electron diffraction. Qualitative tests indicate that the films are relatively hard and adhesive.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 354: Symposium A – Beam Solid Interactions for Materials Synthesis and Characterization , 1994 , 665
Copyright
Copyright © Materials Research Society 1995

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References

1 Liu, A.Y. and Cohen, M.L., Science, 245 841(1989)Google Scholar
2 Cohen, M.L., Science, 261 307(1993)Google Scholar
3 Niu, C., Lu, Y.Z., and Lieber, C.M., Science, 261 334(1993)Google Scholar
4 Schnick, W.: Angew.Chem.Int.Ed.Engl. 32(11) 1580(1993)Google Scholar
5 Corkill, J.L. and Cohen, M.L.: Phys.Rev. B48(23) 17622(1993)Google Scholar
6 Ren, Z.M., Xiong, X.X., Du, Y.C., Wu, J.D., Ying, Z.F., Qiu, Y., and Li, F.M., Chinese Phys.Lett. 11(7) 461(1994)Google Scholar
7 Fujimoto, F. and Qgata, K.: Jpn.J.Appl.Phys. 32 420(1993)Google Scholar
8 Tsai, H. and Bogy, D.B., J.Vac.Sci.Technol., A5(6) 3287(1987)Google Scholar
9 Belton, D.N., Harris, S.J., Schmieg, S.J., Weiner, A.M., and Perry, T.A., Appl.Phys.Lett. 54 416(1989)Google Scholar