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Structure of the Near-Surface Waveguide Layers Produced by Diffusion of Titanium in Lithium Niobate

Published online by Cambridge University Press:  10 February 2011

Y. Avrahami ,
E. Zolotoyabko ,
W. Sauer ,
T. H. Metzger  and
J. Peisl
Y. Avrahami
Affiliation:
Department of Materials Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel, [email protected]
E. Zolotoyabko
Affiliation:
Department of Materials Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel, [email protected]
W. Sauer
Affiliation:
Sektion Physik der Universität Milnchen, Geschwister-Scholl-Platz 1, D-80539 München, Germany
T. H. Metzger
Affiliation:
Sektion Physik der Universität Milnchen, Geschwister-Scholl-Platz 1, D-80539 München, Germany
J. Peisl
Affiliation:
Sektion Physik der Universität Milnchen, Geschwister-Scholl-Platz 1, D-80539 München, Germany
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Abstract

Titanium-induced structural modifications in thin waveguide layers of lithium niobate have been investigated by grazing incidence diffraction and complementary thin film techniques. The study was focused on the high-temperature phase transformation in this system and its influence on the lattice parameter changes, depending on the annealing time.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 213
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

[1] McCoy, M. A., Dregia, S. A., and Lee, W. E., J. Mater. Res., 9, 2029 (1994).10.1557/JMR.1994.2029Google Scholar
[2] Zolotoyabko, E. Avrahami, Y., Sauer, W., Metzger, H., and Peisl, J., Appl. Phys. Lett., 73, 1352 (1998).10.1063/1.122160Google Scholar
[3] Rice, C. E. and Holmes, R. J., J. Appl. Phys., 60, 3836 (1986).10.1063/1.337777Google Scholar
[4] Avrahami, Y. and Zolotoyabko, E., J. Appl. Phys., 85, 6447 (1999).10.1063/1.370286Google Scholar