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Structure of Copper-Hafnium Multilayers

Published online by Cambridge University Press:  26 February 2011

B. M. Clemens ,
J. P. Stec ,
S. M. Heald  and
J. M. Tranquada
B. M. Clemens
Affiliation:
Physics Department, General Motors Research Laboratories, Warren, Michigan 48090–9055
J. P. Stec
Affiliation:
Physics Department, General Motors Research Laboratories, Warren, Michigan 48090–9055
S. M. Heald
Affiliation:
Brookhaven National Laboratory, Upton, New York 11973
J. M. Tranquada
Affiliation:
Brookhaven National Laboratory, Upton, New York 11973
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Abstract

The structure of copper-hafnium multilayers has been studied as a function of composition modulation wavelength by x-ray diffraction and EXAFS. Sputter deposited samples were produced with composition modulation wavelengths of 1/2, 5, 7, 10, 14, and 20 close packed planes of each constituent per layer. The structure evolved anisotropically from amorphous to crystalline with increasing composition modulation wavelength, with crystalline order first appearing in the growth direction in the 7 mono-layer sample. Structural coherence in the growth direction was not observed to extend beyond one elemental layer in any sample, and evidence for a disordered interfacial layer was observed by EXAFS for all samples. Small angle x-ray diffraction showed strong composition modulation for all but the 1/2 monolayer sample. The amorphous interface is the result of reaction during deposition similar to the solid state reaction observed in other systems such as nickel-zirconium.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 77: Symposium D – Interfaces, Superlattices, and Thin Films , 1986 , 489
Copyright
Copyright © Materials Research Society 1987

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References

REFERENces

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