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Structure Determination of Tilt Boundaries in Gold by High Resolution Electron Microscopy

Published online by Cambridge University Press:  26 February 2011

William Krakow  and
David A. Smith
William Krakow
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, USA
David A. Smith
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, USA
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Abstract

A number of tilt grain boundaries prepared from evaporated gold thin films have been investigated by high resolution transmission microscopy. When the grain boundary is parallel to the electron beam and the beam is parallel to a low index rotation axis such as [110] or [001]it is possible to identify atomic positions at the cores of these boundaries as demonstrated here by a Σ = 3 70.5°/[110], (112) growth twin. In many cases it is not possible to make a full atomistic structure determination because the specimen does not have translational periodicity in the beam direction. This may be because the boundary plane is not parallel to the beam or the specimen contains dislocations which have a component of Burgers vector parallel to the beam. Examples are given of various low angle boundary structures in goldwhere there are complications because of the three dimensional nature of their structure.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 409
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

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