Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-25T17:53:57.548Z Has data issue: false hasContentIssue false
  • English
  • Français

Structure Characterization of Epitaxial Strain Relaxation in YBa2Cu3O7−x/PrBa2Cu3O7 Superlattices

Published online by Cambridge University Press:  10 February 2011

María Varela ,
Diego Arias ,
Zouhair Sefrioui ,
Carlos León ,
Carmen Ballesteros  and
Jacobo Santamaría
María Varela
Affiliation:
Dpto. Física, Universidad Carlos III de Madrid, Avda de la Universidad 30, 28911 Leganes, Madrid, Spain
Diego Arias
Affiliation:
Dpto. Fisica Aplicada III, Universidad Complutense, Ciudad Universitaria 28940 Madrid, Spain
Zouhair Sefrioui
Affiliation:
Dpto. Fisica Aplicada III, Universidad Complutense, Ciudad Universitaria 28940 Madrid, Spain
Carlos León
Affiliation:
Dpto. Fisica Aplicada III, Universidad Complutense, Ciudad Universitaria 28940 Madrid, Spain
Carmen Ballesteros
Affiliation:
Dpto. Física, Universidad Carlos III de Madrid, Avda de la Universidad 30, 28911 Leganes, Madrid, Spain
Jacobo Santamaría
Affiliation:
Dpto. Fisica Aplicada III, Universidad Complutense, Ciudad Universitaria 28940 Madrid, Spain
Get access

Abstract

The structure of c-axis oriented [YBa2Cu3O7−(YBCO) N / PrBa2Cu3O7 (PBCO)M/1000Å superlattices with N ranging between 1 and 12 and M=5 unit cells, grown by high oxygen pressure sputtering on (100) SrTiO3 substrates, is analyzed by x-ray diffraction (XRD) and highresolution transmission electron microscopy (HREM). The XRD spectra refinement shows epitaxial strain for YBCO thickness below 4 unit cells. For larger YBCO layer thickness, stress relaxes and step disorder builds up. HREM observations show sharp and flat interfaces between substrate and superlattice stack. The only observable defects are isolated steps or a-axis oriented domains in relaxed samples. The results of both structural tools are compared.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 619: Symposium L – Recent Developments in Oxide & Metal Epitaxy – Theory… , 2000 , 185
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Fernandes, A. A. R., Santamaria, J., Bud'ko, S. L., Nakamura, O., Guimpel, J., Schuller, I. K., Phys. Rev. B 44, 7601 (1991)Google Scholar
2 Attfield, J. P., Kharlanov, A. L., McAllister, J. A., Nature 394, 157 (1998)Google Scholar
3 Schuller, I. K., Nature 394, 419 (1998).Google Scholar
4 Bud'ko, S. L., Guimpel, J., Nakamura, O., Maple, M. B., Schuller, I. K., Phys. Rev B 46, 1257 (1992)Google Scholar
5 Varela, M., Sefrioui, Z., Arias, D., Navacerrada, M. A., , M., Lucia, M.A. Torre, Lopez de la, Loos, G.D., Leon, C., Sanchez-Quesada, F., Santamaria, J., Phys. Rev. Lett. 83, 3936 (1999)Google Scholar
6 Fullerton, E. E., Schuller, I. K., Vanderstraeten, H., Bruynseraede, Y., Phys. Rev. B 45, 9292 (1992)Google Scholar
7 Nakamura, O., Fullerton, E. E., Guimpel, J., Schuller, I. K., Appl. Phys. Lett. 60, 120, (1992)Google Scholar
8 Fullerton, E. E., Guimpel, J., Nakamura, O., Schuller, I. K., Phys. Rev. Lett. 69, 2859 (1992)Google Scholar