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Structure Characteristics of ISD Coated Conductors

Published online by Cambridge University Press:  18 March 2011

Y. L. Tang ,
D. J. Miller ,
B. Ma ,
R. E. Koritala  and
U. Balachandran
Y. L. Tang
Affiliation:
Electron Microscopy Center, Materials Science Division Chemical Technology Division, Argonne National Laboratory, Argonne, IL 60439, U.S.A.
D. J. Miller
Affiliation:
Electron Microscopy Center, Materials Science Division
B. Ma
Affiliation:
Energy Technology Division
R. E. Koritala
Affiliation:
Energy Technology Division
U. Balachandran
Affiliation:
Energy Technology Division
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Abstract

The inclined-substrate deposition (ISD) method for growth of biaxially textured MgO is of interest due to its applications in coated conductors based on high-temperature superconductor (HTS). The ISD method is especially attractive since it offers the potential to produce a high–quality biaxially textured layer in a simple and efficient process. In this work, Yba2Cu3O7-x (YBCO) coated conductors based on two-step deposited MgO buffer layers (ISD and homoepitaxial) on Hastelloy tapes were examined by high-resolution electron microscopy (HREM) to study both the structure of individual layers and, especially, the interfaces between them. Special attention was paid to the MgO buffer layer because of its importance to biaxial YBCO formation. TEM investigation shows the MgO [111] direction is not parallel to the substrate normal but tilted slightly toward the deposition direction. The second layer of MgO has a good epitaxial relationship with the first layer, while dislocations were found near the interface area of the MgO layers. Twin boundaries, which are in the (111) plane, were found between the ISD MgO columns. The multi-buffer layers gave better growth of epitaxial YBCO.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 689: Symposium E – Materials for High-Temperature Superconductor Technologies , 2001 , E7.9
Copyright
Copyright © Materials Research Society 2002

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References

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