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Structure and Thermoelectric Properties Correlation in half-Heusler ZrNiSn- based Bulk Nano-composite Materials by Transmission Electron Microscopy

Published online by Cambridge University Press:  01 February 2011

Dinesh Misra ,
Julien Pierre Amelie Makongo Mangan ,
Michael R. Shabetai ,
Girija Shankar Chaubey ,
John Wiley ,
Kevin L. Stokes  and
Pierre F. P. Poudeu
Dinesh Misra
Affiliation:
[email protected]@gmail.com, University of New Orleans, Advanced Materials Research Institute, New Orleans, Louisiana, United States
Julien Pierre Amelie Makongo Mangan
Affiliation:
[email protected], University of New Orleans, Advanced Materials Research Institute, 2000 Lakeshore Dr, Science Building 2048, New Orleans, Louisiana, 70148, United States, 504-280-5569
Michael R. Shabetai
Affiliation:
[email protected], University of New Orleans, Advanced Materials Research Institute, 2000 Lakeshore Dr, Science Building 2048, New Orleans, Louisiana, 70148, United States, 504-280-5569
Girija Shankar Chaubey
Affiliation:
[email protected], University of New Orleans, Advanced Materials Research Institute, 2000 Lakeshore Dr, Science Building 2048, New Orleans, Louisiana, 70148, United States, 504-280-5569
John Wiley
Affiliation:
[email protected], University of New Orleans, Department of Chemistry and the Advanced Materials Research Institute, 2000 Lakeshore Dr., New Orleans, Louisiana, 70148, United States
Kevin L. Stokes
Affiliation:
[email protected], University of New Orleans, Department of Physics and the Advanced Materials Research Institute, New Orleans, Louisiana, United States
Pierre F. P. Poudeu
Affiliation:
[email protected], University of New Orleans, Department of Chemistry and the Advanced Materials Research Institute, New Orleans, Louisiana, United States
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Abstract

We report the effects of HfO2 nanoparticles as inclusion to the Zr0.5Hf0.5Ni0.8Pd0.2Sn0.99Sb0.01 half-Heusler matrix on the thermoelectric properties. X-ray powder diffraction and transmission electron microscopy were employed for the phase identification and microstructure characterization of the composites. The transport properties are mainly discussed with regards to the microstructure details.

Keywords

compositethermoelectrictransmission electron microscopy (TEM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1267: Symposium DD – Thermoelectric Materials 2010-Growth, Properties, Novel Characterization Methods and Applications , 2010 , 1267-DD06-12
Copyright
Copyright © Materials Research Society 2010

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References

1 Uher, C. Yang, J. Hu, S. Morelli, D.T. Meisner, G.P. Phys. Rev. B59, 8615 (1999).Google Scholar
2 Shen, Q. Chen, L. Goto, T. Hirai, T. Yang, J. Meisner, G.P. Uher, C. Appl. Phys. Lett. 79, 4165 (2001).Google Scholar
3 Shen, Q. Zhang, L. Chen, L. Goto, T. Hirai, T. J. Mater. Sci. Lett. 20, 2197 (2001).Google Scholar
4 Shutoh, N. Sakurai, S. J. Alloys Compd. 389, 204 (2005).Google Scholar
5 Huang, X.Y. Xu, Z. Chen, L.D. et al. , Key Eng. Mater. 249, 79 (2003).Google Scholar
6 Huang, X.Y. Xu, Z. Chen, L.D. Solid. State Communications 130, 181(2004)Google Scholar
7 Skolozdra, R.V. Stadnyk, Y.V. Gorelenko, Y.K. Teletskaya, E.E. Sov. Phys. Solid State 32, 1536 (1990).Google Scholar
8 Nobata, T. Nakamoto, G. Kurisu, M. Makihara, Y. Tokuyoshi, T. Nakai, I. Jpn. J. Appl. Phys. 38, 429 (1999).Google Scholar
9 Nobata, T. Nakamoto, G. Kurisu, M. Makihara, Y. Ohoyama, K. Ohashi, M. J. Alloys Compd. 86, 347, (2002) .Google Scholar
10 Morimura, T. Hasaka, M. Ultramicroscopy 106, 553 (2006).Google Scholar
11 Scoville, N. Bajgar, C. Rolfe, J. et al. , Nanostruct. Mater. 5, 207 (1995).Google Scholar
12 Klemens, P.G. (Proceedings of the 15th International Conference on Thermoelectrics, 1996). p. 207 Google Scholar