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Structure and Morphology of Vitreous Chalcogenide Thin Films Obtained by Plasma-Enhanced CVD
Published online by Cambridge University Press: 21 February 2011
Abstract
Thin films of chalcogenide glasses GeSeywere prepared by PECVD for lithographic applications. Their structure and morphology were characterized by EXAFS and electron microscopy. EXAFS studies enabled comparison of the structures of thin films and those of homologous bulk glasses. Morphology studies by SEM and TEM revealed an heterogeneous structure explained by a phase separation: these glasses consist of microdomains whose size varies with the overall GeSey composition.
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- Copyright © Materials Research Society 1990
References
1.
Yoshikawa, A., Ochi, O, Nagai, H. and Mizushima, Y., Appl. Phys. Lett., 29, 677 (1976); 31, 161 (1977); A. Yoshikawa, O Ochi and Y. Mizushima, Appl. Phys. Lett., 36, 107 (1980).Google Scholar
2.
Shimizu, I., Sakuma, H., Kokado, H. and Inoue, E., Photogr. Sci. Eng.
16, 291 (1972).Google Scholar
3.
Chang, M.S., Hou, T.W., Chen, J.T., Kolwicz, K.D. and Zenel, J.N., J. Vac. Sci. Technol.
16, 1973 (1979).Google Scholar
4.
Ribes, M., Cros, B. and Julien, P., Optical Microlithographic Technology for Integrated Circuit Fabrication and Inspection, Stover, H. L. and Wittecoek, S. Chairs/Editors, SPIE
811, 202 (1987); P. Julien, E. Granneman, B. Cros and M. Ribes, Vide Couches Minces 237 suppl., 37 (1987).Google Scholar
5.
Ong, E., Tai, K.L., Vadimsky, R.G., Kemmerer, C.T. and Bridenbaugh, P.M., SPIE
539, 52 (1985).Google Scholar
6.
Cros, B., Camon, H., Brocheton, Y., Gonchond, J.P., Tissier, A., Balladore, J.L. and Ribes, M., J. Phys.
50,C5–343 (1989).Google Scholar
7.
Peyroutou, C., Peytavin, S., Ribes, M. and Dexpert, H., J. Solid State Chem.
81, 78 (1989).Google Scholar
8.
Peyroutou, C., Peytavin, S., Ribes, M. and Dexpert, H., J. Solid State Chem.
81, 70 (1989).Google Scholar