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Structure and morphology of Clean and Magnesium - Dosed Sapphire Surfaces

Published online by Cambridge University Press:  15 February 2011

Yan Yu  and
R.J. Lad
Yan Yu
Affiliation:
Laboratory for Surface Science & Technology, 5764 Sawyer Research Center, University of Maine, Orono, ME 04469–5764
R.J. Lad
Affiliation:
Laboratory for Surface Science & Technology, 5764 Sawyer Research Center, University of Maine, Orono, ME 04469–5764
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Abstract

The structure and morphology of r-axis (1012) and c-axis (0001) sapphire (a-Al2O3) surfaces were studied with Low Energy and Reflection High Energy Electron Diffraction (LEED and RHEED) and Atomic Force Microscopy (AFM). Following heat treatments at 1000°C in 5×10-7 torr O2, both surfaces exhibited (1×1) diffraction patterns. Regular step-terrace structure was observed on the (1012) surface with the AFM, but no step structure was visible on the (0001) surface. The initial growth of magnesium overlayers dosed onto the (1012) surface at 25°C in ultra-high vacuum was monitored with RHEED and the chemical interactions at the Mg / Al2O3 interface were characterized with X-ray Photoelectron Spectroscopy (XPS). During the initial deposition, very little interaction between mg and the Al2O3 substrate occurs and a very abrupt interface is formed. At larger mg doses, a textured polycrystalline mg overlayer is produced. Annealing the mg film above 300°C causes some oxidation of mg at the Mg / Al2O3 interface, but most of the mg desorbs from the surface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 317: Symposium B – Mechanisms of Thin Film Evolution , 1993 , 583
Copyright
Copyright © Materials Research Society 1994

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References

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