Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-25T14:55:42.913Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural and Electronic Properties of Rare-Earth Nanowires

Published online by Cambridge University Press:  01 February 2011

Andrew Pratt ,
Charles Woffinden ,
Christopher Bonet  and
Steve P. Tear
Andrew Pratt
Affiliation:
[email protected], University of York, Physics, York, United Kingdom
Charles Woffinden
Affiliation:
[email protected], University of York, Physics, York, N. Yorks., United Kingdom
Christopher Bonet
Affiliation:
[email protected], University of York, Physics, York, N. Yorks., United Kingdom
Steve P. Tear
Affiliation:
[email protected], University of York, Physics, York, N. Yorks., United Kingdom
Get access

Abstract

Sub-monolayer coverages of the rare-earth metal Ho were deposited onto Si(001) substrates at elevated temperatures resulting in the formation of rare-earth silicide nanowires. Between the nanowires the substrate area reconstructs into either a 2×4 or 2×7 reconstruction depending on the specific preparation conditions. We have studied the structural and electronic properties of both the nanowires and the reconstructed areas with the complementary techniques of scanning tunneling microscopy (STM) and metastable de-excitation spectroscopy (MDS) revealing the electronic similarities between the 2×4 and 2×7 phases. Evidence for the presence of hybridized Si 3s3p-Ho 6s5d bonds suggests that these reconstructions form as a precursor to nanowire growth.

Keywords

Hoscanning tunneling microscopy (STM)nanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1144: Symposium LL – Nanowires–Systhesis, Properties, Assembly and Applications , 2008 , 1144-LL04-24
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Bowler, D., J. Phys.: Condens. Matter 16, R721 (2004).Google Scholar
2. Ohbuchi, C., Nogami, J., Phys. Rev. B 66, 165323 (2002).Google Scholar
3. Pratt, A., Woffinden, C., Bonet, C. and Tear, S.P., Phys. Rev. B 78, 155430 (2008).Google Scholar
4. Liu, B.Z. and Nogami, J., Surf. Sci. 540, 136 (2003).Google Scholar
5. Liu, B.Z. and Nogami, J., Surf. Sci. 488, 399 (2001).Google Scholar
6. Harada, Y., Masuda, S. and Ozaki, H., Chem. Phys. 97, 1897 (1997).Google Scholar
7. Pratt, A., Roskoss, A., Ménard, H. and Jacka, M., Rev. Sci. Instr. 76, 053102 (2005).Google Scholar
8. Bonet, C., Scott, I. M., Spence, D. J., Wood, T. J., Noakes, T. C. Q., Bailey, P. and Tear, S. P., Phys. Rev. B 72, 165407 (2005).Google Scholar
9. Hofmann, R., Henle, W. A., Netzer, F. P. and Neuber, M., Phys. Rev. B 46, 3857 (1992).Google Scholar
10. Chen, G., Ding, X., Li, Z. and Wang, X., J. Phys.: Condens. Matter 14, 10075 (2002).Google Scholar
11. Pasquali, L. and Nannarone, S., Nucl. Instrum. Methods Phys. Res. B 230, 340 (2005).Google Scholar
12. Magaud, L., Veuillen, J. Y., Lollman, D., Nguyen Tan, T. A., Papaconstantopoulos, D. A. and Mehl, M. J., Phys. Rev. B 46, 1299 (1992).Google Scholar