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A Structural Analysis Method for Graphite Intercalation Compounds

Published online by Cambridge University Press:  18 March 2011

Tatsuo Nakazawa
Affiliation:
Nagano National College of Technology, 716 Tokuma, Nagano-shi, 381-8550, JAPAN
Kyoichi Oshida
Affiliation:
Nagano National College of Technology, 716 Tokuma, Nagano-shi, 381-8550, JAPAN
Takashi Miyazaki
Affiliation:
Nagano National College of Technology, 716 Tokuma, Nagano-shi, 381-8550, JAPAN
Morinobu Endo
Affiliation:
Shinshu University, 4-17-1 Wakasato, Nagano-shi, 380-8553, JAPAN
Mildred S. Dresselhaus
Affiliation:
Currently on leave from the Massachusetts Institute of Technology, Cambridge, MA 02139, USA
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Abstract

Study of the microstructure of electronic materials can be enhanced by using high resolution transmission electron microscopy (TEM) combined with the technique of digitized image analysis. We show here a practical image analysis method for the microstructures of acceptor graphite intercalation compounds (GICs) with CuCl2 and FeCl3 intercalates. The two dimensional fast Fourier transform (2D-FFT) was used for the frequency analysis of the TEM pictures. It is found that the lattice images of CuCl2-GICs consist of different frequency images corresponding to specific frequencies. The detailed features of the stage-1 structure of the FeCl3-GICs is extracted quantitatively by this method from a relatively indistinct TEM picture. The stage structure of the CuCl2- and FeCl3-GICs are further investigated by analyzing the reconstruction of the TEM images by means of the two dimensional inverse FFT (2D-IFFT).

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1. Koyama, T., Endo, M. and Onuma, Y., Jpn. J. Appl. Phys., 11, 445 (1972).Google Scholar
2. Endo, M., Chemtech, American Chemical Society, 18, 568 (1988).Google Scholar
3. Endo, M., Chieu, T. C., Timp, G., Dresselhaus, M. S., Synthetic Metals, 8, 251 (1983).Google Scholar
4. Oshida, K., Endo, M., Nakajima, T., Vittorio, S. L. di, Dresselhaus, M. S., and Dresselhaus, G., J. Mater. Res., 8, 512 (1993).Google Scholar
5. Endo, M., Oshida, K., Kobori, K., Takeuchi, K., Takahashi, K., and Dresselhaus, M. S., J. Mater. Res., 10, 1461 (1995).Google Scholar
6. Oshida, K. and Nakazawa, T., Memoirs of Nagano National College of Technology, 34, 41 (2000).Google Scholar
7. Oshida, K., Kogiso, K., Matsubayashi, K., Takeuchi, K., Kobori, S., Endo, M., Dresselhaus, M. S., and Dresselhaus, G., J. Mater. Res., 10, 2507 (1995).Google Scholar