Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-29T07:49:09.441Z Has data issue: false hasContentIssue false

Stress and Hardness of CrNx films

Published online by Cambridge University Press:  15 March 2011

G.C.A.M. Janssen
Affiliation:
Department of Material Science and Technology, Delft University of Technology, the Netherlands, e-mail: [email protected]
J.-D. Kamminga
Affiliation:
Netherlands Institute for Metals Research, Delft, the Netherlands
W.G.M. Sloof
Affiliation:
Department of Material Science and Technology, Delft University of Technology, the Netherlands, e-mail: [email protected]
Get access

Abstract

Chromium nitride films CrNx with x ranging form 0 to 1 were deposited by reactive PVD. Both stress and hardness in the films are a function of the composition. The growth stress and hardness for the majority of the films can be related through the Hall Petch relation. It is shown that the hardest films fall outside this relation. It is also shown that the hardest films are nanocrystalline. It is argued that the hardness of these films is a consequence of the nanocrystallinity of these films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hovsepian, P.E. et al., Surface and Coatings Technology 116–119, 727 (1999]Google Scholar
2. Warren, B.E., X-ray diffraction, (Assison-Wesley, Reading, Masschusetts, 1969) p.251 Google Scholar
3. Hoy, R., to be publishedGoogle Scholar
4. Doljack, F.A. and Hoffman, R.W., Thin Solid Films, 12, 71 (1972)Google Scholar
5. Hirth, John Price and Lothe, Jens, Theory of dislocations, 2nd ed. (John Wiley, New York, 1982) p.778 Google Scholar