Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T17:52:12.473Z Has data issue: false hasContentIssue false
  • English
  • Français

STRAIN IN MAGNETIC EuS/SrS SUPERLATTICES INVESTIGATED BY He ION CHANNELING

Published online by Cambridge University Press:  28 February 2011

S. MANTL ,
CH. BUCHAL ,
B. STRITZKER  and
B. SAFTIC
S. MANTL
Affiliation:
Kernforschungsanlage Jülich, IFF, P.O. Box 1913, D-5170 Jülich, FRG
CH. BUCHAL
Affiliation:
Kernforschungsanlage Jülich, IFF, P.O. Box 1913, D-5170 Jülich, FRG
B. STRITZKER
Affiliation:
Kernforschungsanlage Jülich, IFF, P.O. Box 1913, D-5170 Jülich, FRG
B. SAFTIC
Affiliation:
Kernforschungsanlage Jülich, IFF, P.O. Box 1913, D-5170 Jülich, FRG
Get access

Abstract

He ion channeling experiments indicate that molecular beam grown epitaxial multilayers of EuS/SrS on (111) Si are under strain. Angular scans of the normalized He backscattering yields showed that inclined [100] directions vary by 0.28 ± 0.05º between the first two 30 nm thick layers due to tetragonal distortion of the EuS and SrS lattices. Comparison of theoretical estimated kink angles and experimental results indicated cormplete elastic accommodation of the 0.9 % lattice mismatch between EuS and SrS in the superlattice. In contrast, thin EuS layers on (111) Si are epitaxial but incommensurate because of the large 10 % lattice mismatch.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 56: Symposium H – Layered Structures and Epitaxy , 1985 , 195
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Kwo, J., Gyorgy, E.M., McWham, D.B., Hong, M., DiSalvo, F.J., Vettier, C. and Bower, J.E., Phys. Rev. Lett. 55 (1985) 1402 Google Scholar
[2] Mantl, S., Ch. Buchal, Stritzker, B. and Saftic, B., Nucl. Inst. and Meth. B, to be publishedGoogle Scholar
[3] J. Kbhne G Mair' Rasula, N., Saftic, B. and Zinn, W., J. de Physique C5 (19801 17Google Scholar
[4] Joint Committe on Powder Diffraction Standards (JCPDS Cards) (1976) 26-1419, 8-489Google Scholar
[5] Picraux, S.T., Dawson, L.R., Osbourn, G.C., Biefeld, R.M. and Chu, W.K., Appl. Phys. Lett 43 (1983) 1020 CrossRefGoogle Scholar
[6] Fiory, A.T., Feldman, L.C., Bean, J.C. and Robinson, I.K., Mat. Res. Soc. Symp. Proc. 25 (1984) 497 Google Scholar
[7] Pan, C.K., Zhang, D.C., Finstad, T.G., Chu, W.K., Speriosu, V.S., M.-A. Nicolet and Barrett, J.H., Phys. Rev. B 31 (1985) 1270 Google Scholar
[8] Hornstra, J. and Bartels, W.J., J. Cryst. Growth 44 (1978) 513 CrossRefGoogle Scholar
[9] Shapira, Y. and Reed, T.B., AIP Conf. Proc. 5 (1971) 837 Google Scholar
[10] Only the bulk modulus B = 580 kbar of SrS has been measured (EuS: 610 + 30 kbar) Syassen, K., to be publishedGoogle Scholar