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Strain Analysis in PbTe/PbMnTe Superlattices by X-Ray Diffraction

Published online by Cambridge University Press:  22 February 2011

E. P. Koppensteiner ,
H. Krenn ,
N. Frank  and
G. Bauer
E. P. Koppensteiner
Affiliation:
Institut für Halbleiterphysik, A-4040 Linz, Austria
H. Krenn
Affiliation:
Institut für Halbleiterphysik, A-4040 Linz, Austria
N. Frank
Affiliation:
Institut für Halbleiterphysik, A-4040 Linz, Austria
G. Bauer
Affiliation:
Institut für Halbleiterphysik, A-4040 Linz, Austria
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Abstract

The strain tensor components of the PbTe and PbMnTe constituent layers of three superlattices grown on (111) oriented BaF2 substrates are determined from an X-ray analysis. Symmetric (222) and asymmetric (426), (224), (244) Bragg reflections were analysed and a generalization of the Hornstra-Bartels model is used, assuming that the SL (superlattice) can be simulated accordingly. Since in the multilayers also the satellites of the symmetric and asymmetric reflections have been considered the strain tensor components were determined with an accuracy of 1.5×10-4. Consequently the Mn-content of the PbMnTe layers could be determined with an accuracy of ± 0.03%.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 239: Symposium D – Thin Films: Stresses and Mechanical Properties III , 1991 , 521
Copyright
Copyright © Materials Research Society 1992

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References

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