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Steady-State Creep of Thick and Thin-Film Multilayers

Published online by Cambridge University Press:  15 February 2011

Y.-L. Shen  and
S. Suresh
Y.-L. Shen
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
S. Suresh
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
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Abstract

The steady-state creep response of multilayered polycrystalline materials subjected to cyclic variations in temperature is analyzed. The approach presented here is capable of predicting the evolution of curvature, the thermal stresses, and the dominant deformation mechanisms at any through-thickness location of each layer for prescribed layer geometries and thermo-mechanical properties of the constituent layers. The Al-Al2O3 model system is considered, where the dominant relaxation mechanism in Al is studied as the layer thickness is systematically varied. Creep due to grain boundary diffusion is found to become more significant in thin layers with a three-dimensional equiaxed grain structure. The effects of columnar grain structure in Al thin films on the thermal cycling response are also discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 403: Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II , 1995 , 133
Copyright
Copyright © Materials Research Society 1996

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