Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T07:44:47.668Z Has data issue: false hasContentIssue false

Spin Polarized Low Energy Electron Microscopy (Spleem) of Single and Combined Layers of Co, Cu, and Pd on W (110)

Published online by Cambridge University Press:  03 September 2012

Helmut Poppa
Affiliation:
IBM Research, Almadén Research Center, 650 Harry Rd.,San Jose, CA 95120
Heiko Pinkvos
Affiliation:
Physikalisches Institut, Universitaet Clausthal, 3392-Clausthal-Zellerfeld, Leibnizstrasse 4, Germany
Karsten Wurm
Affiliation:
Physikalisches Institut, Universitaet Clausthal, 3392-Clausthal-Zellerfeld, Leibnizstrasse 4, Germany
Ernst Bauer
Affiliation:
IBM Research, Almadén Research Center, 650 Harry Rd.,San Jose, CA 95120
Get access

Abstract

In-situ recording of ultra-thin film growth by Low Energy Electron Microscopy (LEEM) results in accurate determinations of monolayer metal deposition rates for difficult to calibrate deposition geometries. Deposition rates and growth features were determined for Cu and Co on W (110) allowing for thickness control at the submonolayer level. Also, the transparencies of non-Magnetic overlayers of Pd (111) and Cu (111) to very low energy spin polarized electrons were compared and qualitatively explained by band structure considerations. Cu (111) is much more transparent than Pd (111) so that magnetic domain structures can be observed through at least 4 nmof Cu (111). This suggests the use of Cu (111) and other metals of suitable band structure as protective layers for surface magnetic studies.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Parkin, S.S.S., Phys. Rev. Lett. 67 (1991), 3598 Google Scholar
[2] Farrow, R.F.C., Lee, C.H., Marks, R.F., Harp, G.. Toncy, M., Rabcdeau, T.A., Weller, D., Bracndle, H., in “Magnetism and Structure in systems of Reduced Dimension”, NATO ASI Series, Plenum Publishing Corp., NY / NY (1993)Google Scholar
[3] Johnson, M.T., Coehorn, R., de Vries, J.J., McGec, N.W.E., van de Stegge, J., Bloemen, P.J.H., Phys. Rev. Lett., 69 (1992), 969 Google Scholar
[4] Bader, S.D., Liu, C., J. Vac. Sci. Technol., A9 (1991), 1924 Google Scholar
[5] Egelhoff, W.F. Jr, Kief, M.T., Phys. Rev. B45 (1992). 7795 Google Scholar
[6] de Miguel, J.J., Cebollada, A.. Gallego, J.M., Miranda, R., Schneider, C.M., Schuster, P., Kirschner, J., J. Magn. Magn. Mater. 93 (1991), 1 Google Scholar
[7] Unguris, J., Celotta, R.J., Pierce, D.T., Phys. Rev. Lett. 69 (1992). 1125 Google Scholar
[8] Prinz, G.A., Ultramicroscopy 47 (1992), 346 Google Scholar
[9] Kohlhepp, J., Elmers, H.J., Cordes, S., Gradmann, U., Phys. Rev. B45 (1990), 12287 Google Scholar
[10] Schaefer, R., Hubert, A., phy. stat. sol (a) 118 (1990). 271 Google Scholar
[11] Stoehr, J., cf. the contribution in this volumeGoogle Scholar
[12] Unguris, J., Scheinfein, M.R., Celotta, R.J., Pierce, D.T.. Appl. Phys. Lett 55 (1989), 2553 Google Scholar
[13] Allenspach, R., Stampanoni, M., Bischof, A., Phys. Rev. Lett. 65 (1990), 3344 Google Scholar
[14] Oepen, H.P., J. Magn. Magn. Mater. 93 (1991), 116 Google Scholar
[15] Altman, M.S., Pinkvos, H., Hurst, J., Poppa, H., Marx, G., Bauer, E., Mater. Res. Soc. Symp. Proc. 232 (1991), 125 Google Scholar
[16] Pinkvos, H., Poppa, H., Bauer, E., Hurst, J., Ultramicroscopy 47 (1992), 339 Google Scholar
[17] Pinkvos, H., Poppa, H., Bauer, E., Kim, G.-M.. in “Magnetism and Structure in systems of Reduced Dimension”, NATO ASI Series, Plenum Publishing Corp., NY / NY (1993)Google Scholar
[18] Bauer, E., in: “Chemistry and Physics of Solid Surfaces VIII”, Vanselow, R., Howe, R., ed., Springer, Berlin (1990), p. 267 Google Scholar
[19] Bauer, E., Poppa, H., Thin Solid Films 12 (1972), 167 Google Scholar
[20] Bauer, E., Ber. Bunsenges. Phys. Chem. 95 (1991), # 11Google Scholar
[21] Bauer, E., Mat. Res. Symp. Proc. 198 (1990). 353 Google Scholar
[22] Bauer, E., Poppa, H., Todd, G., Bonczek, F., J. Appl. Phys. 45 (1974), 5164 Google Scholar
[23] Bauer, E., Mundschau, M., Swiech, W., Telieps, W.. Ultramicroscopy 31 (1989), 49 Google Scholar
[24] to be publishedGoogle Scholar
[25] Kerkmann, D., Pescia, D., Kremer, J.W., Vescovo, E., Z. Phys. B 85 (1991), 311 Google Scholar
[26] Jonker, B. T., Bartelt, N.C., Park, R.I., Surf. Sci. 127 (1983), 183 Google Scholar
[27] Bauer, E., J. Vac. Sci. Technol 7 (1970), 3.Google Scholar