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Spatially-Resolved Non-Contact Methods for the Investigation of Transport and Defects in Semiconductors

Published online by Cambridge University Press:  25 February 2011

Nabil M. Amer
Nabil M. Amer*
Affiliation:
Applied Physics and Laser Spectroscopy Group, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
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Abstract

Photothermal spectroscopy employs the small rise in temperature associated with the absorption of electromagnetic radiation to probe optical and transport properties of materials. A review of the various photothermal detection schemes is given, and examples which illustrate the power of this technique are reviewed.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 69: Symposium D – Materials Characterization , 1986 , 51
Copyright
Copyright © Materials Research Society 1986

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References

[1] Jackson, W.B., Amer, N.M., Boccara, A.C., and Fournier, D., Appl. Opt. 20, 1333 (1981)CrossRefGoogle Scholar
[2] Jackson, W.B. and Amer, N.M., Phy. Rev. B25, 5559 (1982).CrossRefGoogle Scholar
[3] Fournier, D., Boccara, A.C., Amer, N.M., and Gerlach, R., App. Phys. Lett. 87, 419 (1980).Google Scholar
[4] Amer, N.M. and Olmstead, M.A., Surf. Sci. 182, 68 (1983); M.A. Olmstead, N.M. Amer, S. Kohn, D. Fournier, and A.C. Boccara, Appl. Phys. A 82, 141 (1983).CrossRefGoogle Scholar
[5] Olmstead, M. A. and Amer, N. M., Phys. Rev. Lett 52, 1148 (1985).CrossRefGoogle Scholar
[6] Olmstead, M.A. and Amer, N.M., Phys. Rev. B 29, 7048 (1984).Google Scholar
[7] Skumanich, A., Fournier, D., Boccara, A.C., and Amer, N.M., Appl. Phys. Lett. 47, 402 (1985); J. Appl. Phys. 59, 787 (1986).Google Scholar