Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-05T17:16:50.000Z Has data issue: false hasContentIssue false
  • English
  • Français

Sliding Friction by Atomic Force Microscopy

Published online by Cambridge University Press:  10 February 2011

V. Pasquier  and
J. M. Drake
V. Pasquier
Affiliation:
Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801, [email protected]
J. M. Drake
Affiliation:
Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801, [email protected]
Get access

Abstract

Lateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 543: Symposium W – Dynamics in Small Confining Systems IV , 1998 , 51
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Timoshenko, S.P., Goodier, J.N., Therory of elasticity, McGraw Hill New York 1987.Google Scholar
2 Senden, T.J., Ducker, W.A., Langmuir, 10, 1003,1994.Google Scholar
3 Cleveland, j.p., Manne, S., Bocek, D., Hansma, P.K., Rev. Sci. Instrum. 64, 403,1993.Google Scholar
4 Hutter, J.L., Bechhoefer, J., Rev. Sci. Instrum. 64, 1868, 1993; H.J., Butt, M. Jaschke, Nanotechnology, 6, 1, 1995.Google Scholar
5 Buenviaje, C., Ge, S.R., Rafailovich, M.H., Ovemey, R.M., Mat. Res. Soc. Proc. 522,187,1998.Google Scholar
6 Ogletree, D.F., Carpick, R.W., Salmeron, M., Rev. Sci. Instrum. 67, 3298,1996.Google Scholar
7 Ovemey, R., Meyer, E., MRS Bulletin, 26, May 1993.Google Scholar
8 Khurshurdov, A.G., Kato, K., Koide, H., Tribol. Left. 2, 345, 1996; Bhushan, B., Tribology ans Mechanics of Magnetic Storage Devices, Springer, New York, p171, 1990.Google Scholar
9 Rabinowicz, E., Friction and wear of materials, John Wiley & sons, 1965.Google Scholar
10 Schwarz, U.D., Köster, P., Weisendanger, R., Rev. Sci. Instrum. 67, 2560, 1996.Google Scholar
11 Odin, C., Aime, J.P., Kaakour, Z. El, Bouhacina, T., Surf.Sci. 317, 321, 1994; S.S. Sheiko, M.Möller, E.M.C.M Reuvekamp, H.W. Zandbergen, Ultramicroscopy, 53, 371, 1994; R.W. Carpick, N. Agraït, D.F. Ogletree, M. Salmeron, J. Vac. Sci. Technol. B. 14,1289, 1996.Google Scholar
12 Burnham, N.A., Kulik, A.J., Gremaud, G., Gallo, P.J., Oulevey, F., Vac, J.. Technol. B, 14, 794, 1996; N.A. Bumham, G. Gremaud, A.J. Kulik, P.J. Gallo, F. Oulevey, J. Vac. Technol. B, 14, 1996.Google Scholar
13 Troyon, M., Wang, Z., Pastre, D., Lei, H.N., Hazotte, A., Nanotechnology, 8, 163, 1997.Google Scholar
14 Iler, H.K., The Chemistry of Silica, Wiley & Sons Interscience, 1979.Google Scholar
15 Pasquier, V., Drake, J.M., to be published.Google Scholar
16 Tabor, D., J. Coll. & Interf. Sci. 58, 2, 1977.Google Scholar
17 Hertz, H., J. Reine Angew. Math. 92, 156, 1881; K.L. Johnson, Contact Mechanics, CUP, 1985.Google Scholar
18 Derjaguin, B.V., Muller, V.M., Toporov, Y.P., J. Coll. & Interf. Sci. 53, 314,1975.Google Scholar
19 Vigil, G., Xu, Z., Steinberg, S., Israelachvili, J., J. Coll. & Interf. Sci. 165, 367, 1994.Google Scholar