No CrossRef data available.
Published online by Cambridge University Press: 31 January 2011
Soft ionization mass spectrometry (MS) methods [Electro-Spray Ionisation - Fourier Transform Ion Cyclotronic Resonance MS (ESI-FTICRMS) and Matrix Assisted Laser Desorption Ionization coupled with Time of Flight MS (MALDI-TOFMS)] and associated fragmentation techniques appear to be an alternative way providing data on the size, stability and exact chemical composition of nanoparticles and their precursors, and potentially on interactions between particles. We report the application of both mass spectrometry techniques to analyze II-VI semiconductor nanomaterials (CdX with X = S or Se) and their organometallic precursors.