Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-09T09:00:05.621Z Has data issue: false hasContentIssue false
  • English
  • Français

Simulations of Electron Diffraction Contrast Images of Nanometer-sized Dislocation Loops

Published online by Cambridge University Press:  01 February 2011

Zhongfu Zhou ,
Sergei L Dudarev ,
Michael L Jenkins ,
Adrian P Sutton  and
Marquis A Kirk
Zhongfu Zhou
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford 0X1 3PH, UK
Sergei L Dudarev
Affiliation:
EURATOM/UKAEA Fusion Association, Culham Science Centre, Oxfordshire 0X14 3DB, UK
Michael L Jenkins
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford 0X1 3PH, UK
Adrian P Sutton
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford 0X1 3PH, UK Laboratory of Computational Engineering, PO Box 9203, FIN 02015 HUT, Finland
Marquis A Kirk
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL60439, USA
Get access

Abstract

A computer code has been developed to solve numerically the Howie-Basinski equations of electron diffraction theory, and has been applied to simulate diffraction contrast images of small dislocation loops under weak-beam diffraction conditions. In this paper we describe the basis of the code, and apply it to simulate weak-beam images of small loops under a variety of imaging conditions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 792: Symposium R – Radiation Effects and Ion Beam Processing of Materials , 2003 , R4.4
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Jenkins, M. L. and Kirk, M. A., Characterization of Radiation Damage by Transmission Electron Microscopy, (Bristol and Philadelphia: Institute of Physics Publishing, 2001)Google Scholar
2. Cockayne, D. J. H., Ray, I. L. F., and Whelan, M. J., Phil. Mag., 20, 1265 (1969)Google Scholar
3. Howie, A. and Basiński, Z. S., Phil. Mag., 17, 1039, (1968)Google Scholar
4. Zhou, Z., Dudarev, S. L., Jenkins, M. L., and Sutton, A. P., Proc. EM AG 2003, (Institute of Physics, Oxford, 2003) (in press)Google Scholar
5. Jenkins, M. L., Kirk, M. A., and Fukushima, H., J. Electron Microscopy, 48, 323 (1999)Google Scholar
6. Jenkins, M. L., Cockayne, D. J. H., and Whelan, M. J., J. Microscopy, 98, 155 (1973)Google Scholar