Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-27T02:31:37.934Z Has data issue: false hasContentIssue false
  • English
  • Français

A Simulation of Rotational Hysteresis Energy Loss in Longitudinal Thin-Film Media

Published online by Cambridge University Press:  10 February 2011

Wei Yang  and
David N. Lambeth
Wei Yang
Affiliation:
Data Storage Systems Center, Department of Electrical and Computer Engineering Carnegie Mellon University, Pittsburgh, PA 15213
David N. Lambeth
Affiliation:
Data Storage Systems Center, Department of Electrical and Computer Engineering Carnegie Mellon University, Pittsburgh, PA 15213
Get access

Abstract

The field dependence of the rotational hysteresis energy loss was simulated for longitudinal thin-film media with the purpose of examining the validity of this method for measuring the anisotropy field. The field at which the rotational hysteresis vanishes, which is usually taken as the experimentally measured anisotropy field, was found to be smaller than the real anisotropy field when intergranular magnetostatic and exchange interactions are included in the simulations. Hence the rotational hysteresis method may result in an underestimation of the anisotropy field for the films with non-negligible grain interactions. To confirm this experimentally, two CoCrTa films, one with strong in-plane easy axis texture and the other with uniaxially aligned grain easy axes, were prepared under the same conditions. The anisotropy field determined by the rotational hysteresis of the first sample was found to be smaller than the more accurate value obtained from the hard axis hysteresis loop of the second sample.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 517: Symposium F – Wide Bandgap Semiconductors for High Power, High Frequency , January 1998 , 285
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Stoner, E.C. and Wohlfarth, E.P., Trans. Roy. Soc. (London) A240, 599(1948).10.1098/rsta.1948.0007Google Scholar
[2] Charap, S.H., Lu, P.-L., and He, Y., IEEE Trans. Magn. 33, 978(1997).10.1109/20.560142Google Scholar
[3] Bean, C.P. and Meiklejohn, W.H., Bull. Am. Phys. Soc. Ser. II. 1, 148(1956).Google Scholar
[4] Jacobs, I.S. and Luborsky, F.E., J. Appl. Phys. 28, 467(1957).10.1063/1.1722773Google Scholar
[5] Yang, W., Lambeth, D.N., and Laughlin, D.E., to be published.Google Scholar
[6] Yang, W. and Lambeth, D.N., IEEE Trans. Magn. 33, 2965(1997).10.1109/20.617812Google Scholar