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Simulated Image Maps for Use in Experimental High-Resolution Electron Microscopy

Published online by Cambridge University Press:  25 February 2011

Michael A. O'Keefe ,
Ulrich Dahmen  and
Crispin J.D. Hetherington
Michael A. O'Keefe
Affiliation:
National Center for Electron Microscopy, University of California, Lawrence Berkeley Laboratory, I Cyclotron Road, Berkeley, CA 94720.
Ulrich Dahmen
Affiliation:
National Center for Electron Microscopy, University of California, Lawrence Berkeley Laboratory, I Cyclotron Road, Berkeley, CA 94720.
Crispin J.D. Hetherington
Affiliation:
National Center for Electron Microscopy, University of California, Lawrence Berkeley Laboratory, I Cyclotron Road, Berkeley, CA 94720.
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Abstract

A “map” of all possible high-resolution images may be simulated for a crystalline specimen in a chosen orientation for any particular transmission electron microscope (HRTEM). These maps are useful during experimental high-resolution electron microscopy and make it possible to locate optimum imaging conditions even for foil thicknesses beyond the weak-phase object limit. Although defects such as grain boundaries are not generally periodic, image maps of perfect crystal can be used to optimize defect contrast during operation of the microscope by reference to the image of the perfect crystal neighboring the defect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 159: Symposium C – Atomic Scale Structure of Interfaces , 1989 , 453
Copyright
Copyright © Materials Research Society 1990

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References

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