Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-27T17:58:06.408Z Has data issue: false hasContentIssue false

Sheet Density and Well Thickness Effects on Photoluminescence from Pseudomorphic HEMT Structures

Published online by Cambridge University Press:  26 February 2011

C. Colvard
Affiliation:
Siemens Corporate Research, Inc., 755 College Rd. East, Princeton, NJ 08540
N. Nouri
Affiliation:
Siemens Corporate Research, Inc., 755 College Rd. East, Princeton, NJ 08540
H. Lee
Affiliation:
Siemens Corporate Research, Inc., 755 College Rd. East, Princeton, NJ 08540
D. Ackley
Affiliation:
Siemens Corporate Research, Inc., 755 College Rd. East, Princeton, NJ 08540
Get access

Abstract

Low temperature photoluminescence was studied in a large number of pseudomorphic HEMT's having an InxGa1−xAs quantum well. The spectra show strong qualitative differences when the Fermi level is above or below the second conduction subband, and in the latter case they are power dependent. A slight enhancement is seen at the Fermi edge only when it lies close to the higher subband. Excellent agreement is found between the measured Fermi energy and the two-dimensional carrier density in the well.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Sooryakumar, R., Pinczuk, A., Gossard, A.C., Chemla, D.S., and Sham, L.J., Phys. Rev. Lett., 58, 1150 (1987).CrossRefGoogle Scholar
2. Skolnick, M.S., Rorison, J.M., Nash, K.J., Mowbray, D.J., Tapster, P.R., Bass, S.J., and Pitt, A.D., Phys. Rev. Lett. 58, 2130 (1987).CrossRefGoogle Scholar
3. Livescu, G., Miller, D.A.B., Chemla, D.S., Ramaswamy, M., Chang, T.Y., Sauer, N., Gossard, A.C., and English, J.H., IEEE J. Quantum Electron. 24, 1677 (1988).Google Scholar
4. Penna, A.F.S., Shah, J., Pinczuk, A., Sivco, D., and Cho, A. Y., Appl. Phys. Lett. 46, 184 (1985).CrossRefGoogle Scholar
5. Chang, C.H., Lyon, S.A., and Tu, C.W., Appl. Phys. Lett. 53, 285 (1988).Google Scholar
6. Lyo, S.K. and Jones, E.D., Phys. Rev. B38, 4113 (1988).CrossRefGoogle Scholar
7. Sooryakumar, R., Chemla, D.S., Pinczuk, A., Gossard, A., Wiegmann, W., and Sham, L.J., Solid State Commun. 54, 859 (1985).CrossRefGoogle Scholar
8. Colvard, C., Nouri, N., Lee, H., and Ackley, D., unpublished.Google Scholar