Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-29T09:13:29.475Z Has data issue: false hasContentIssue false
  • English
  • Français

Self-Induced Photon Absorption by Screening of the Electric Fields in Nitride-based Quantum Wells

Published online by Cambridge University Press:  11 February 2011

S. Kalliakos ,
P. Lefebvre ,
T. Taliercio  and
B. Gil
S. Kalliakos
Affiliation:
GES – CNRS – Université Montpellier II. CC 074, 34095 Montpellier Cedex 5, France.
P. Lefebvre
Affiliation:
GES – CNRS – Université Montpellier II. CC 074, 34095 Montpellier Cedex 5, France.
T. Taliercio
Affiliation:
GES – CNRS – Université Montpellier II. CC 074, 34095 Montpellier Cedex 5, France.
B. Gil
Affiliation:
GES – CNRS – Université Montpellier II. CC 074, 34095 Montpellier Cedex 5, France.
Get access

Abstract

We have calculated the change of interband absorption spectra of a quantum well based on hexagonal group-III nitride semiconductors under photo-injection of high densities of electron-hole pairs. The screening of internal electric fields by such optical excitation is known to blue-shift and reinforce the ground-state optical transition. Due to the large values of densities of states and of internal fields, we predict novel properties that rather concern optical absorption via transitions between excited states. The absorption coefficient can be strongly enhanced by the optical excitation itself, in this particular spectral region, yielding the possibility for self-induced absorption properties. In other words, if sufficiently intense, an excitation laser can increase the absorption coefficient of the system at its own wavelength, thus providing a strong nonlinear optical response. Finally, we briefly discuss the potential application of these optical phenomena.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 743: Symposium L – GaN and Related Alloys , 2002 , L11.5
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Nakamura, S., Senoh, M., Nagahama, A., Iwasa, N., Yamada, T., Matsushita, T. and Kiyoku, H., Appl. Phys. Lett 70, 2753 (1997).Google Scholar
2. Bernardini, F., Fiorentini, V. and Vanderbilt, D., Phys. Rev. B 56, R10024 (1997).Google Scholar
3. Bernardini, F., Fiorentini, V. and Vanderbilt, D., Phys. Rev. Lett. 79, 3958 (1997).Google Scholar
4. Bernardini, F. and Fiorentini, V., Phys. Rev. B 57, R9472 (1998).Google Scholar
5. Im, Jin Seo, Kollmer, H., Off, J., Sohmer, A., Scholz, F., and Hangleiter, A., Phys. Rev. B 57, R9435 (1998)Google Scholar
6. Leroux, M., Grandjean, N., Laügt, M., Massies, J., Gil, B., Lefebvre, P. and Bigenwald, P., Phys. Rev. B 58, R13371 (1998).Google Scholar
7. Lefebvre, P., Allègre, J., Gil, B., Mathieu, H., Grandjean, N., Leroux, M., Massies, J. and Bigenwald, P., Phys. Rev. B 59, 15363 (1999).Google Scholar
8. Lefebvre, P., Morel, A., Gallart, M., Taliercio, T., Allègre, J., Gil, B., Mathieu, H., Damilano, B., Grandjean, N. and Massies, J., Appl. Phys. Lett 78, 1252 (2001).Google Scholar
9. Damilano, B., Grandjean, N., Semond, F., Massies, J., and Leroux, M., Appl. Phys. Lett. 75, 962 (1999)Google Scholar
10. Widmann, F., Simon, J., Daudin, B., Feuillet, G., Rouvière, J.L., Pelekanos, N.T., and Fishman, G., Phys. Rev. B 58, (1998) R15989 Google Scholar
11. Nardelli, M. B., Rapcewicz, K. and Bernholc, J., Appl. Phys. Lett. 71, 3135 (1997).Google Scholar
12. Honda, T., Miyamoto, T., Sakaguchi, T., Kawanishi, H., Koyanca, F. and Iga, K., J. Cryst. Growth 189/190, 644 (1998).Google Scholar
13. Bigenwald, P., Kavokin, A., Gil, B. and Lefebvre, P., Phys. Rev. B 61, 15621 (2000).Google Scholar
14. Boring, P., Gil, B. and Moore, K. J., Phys. Rev. Lett. 71, 1875 (1993).Google Scholar
15. Smith, D.L. and Mailhiot, C., Phys. Rev. Lett. 58, 1264 (1987).Google Scholar
16. Huang, X.R., Harken, D.R., Cartwright, A.N., Smirl, A.L., Sanchez-Rojas, J.L., Sacedon, A., Calleja, E. and Muñoz, E., Appl. Phys. Lett. 67, 950 (1995).Google Scholar
17. Gainer, G. H., Kwon, Y. H., Lam, J. B., Bidnyk, S., Kalashyan, A., Song, J. J., Choi, S. C. and Yang, G. M., Appl. Phys. Lett. 78, 3890 (2001).Google Scholar
18. Łepkowski, S.P., Suski, T., Perlin, P., Ivanov, V. Yu., Godlewski, M., Grandjean, N. and Massies, J., J. Appl. Phys. 91, 9622 (2002).Google Scholar
19. Sala, F. Della, Di Carlo, A., Lugli, P., Bernardini, F., Fiorentini, V., Scholz, R. and Jancu, J., Appl. Phys. Lett. 743, 2002 (1999).Google Scholar
20. Kuokstis, E., Yang, J.W., Simin, G., Khan, M. Asif, Gaska, R. and Shur, M.S., App. Phys. Lett. 80, 977 (2002).Google Scholar
21. Reale, A., Di Carlo, A., Lugli, P. and Kavokin, A., Phys. Stat. Sol. (a) 183, 121 (2001).Google Scholar
22. Vinattieri, A., Alderighi, D., Kudrna, J., Colocci, M., Reale, A., Di Carlo, A., Lugli, P., Semond, F., Grandjean, N. and Massies, J., Phys. Stat. Sol. (a) 190, 87 (2002).Google Scholar
23. Reale, A., Massari, G., DiCarlo, A. and Lugli, P., Phys. Stat. Sol. (a) 190, 81 (2002).Google Scholar
24. Shikanai, A., Deguchi, T., Sota, T., Kuroda, T., Takeuchi, A., Chichibu, S. and Nakamura, S., Appl. Phys. Lett 76, 454 (2000).Google Scholar
25. Chow, W., Kira, M. and Koch, S. W., Phys Rev B 60, 1947 (1999). [38]Google Scholar
Park, S.H. and Chuang, S.-L., Appl. Phys. Lett. 72, 287 (1998).Google Scholar
26. Park, S.H. and Chuang, S.-L., Appl. Phys. Lett. 72, 287 (1998).Google Scholar
27. Park, S.H. and Chuang, S.-L., Appl. Phys. Lett. 76, 287 (2000).Google Scholar
28. Gil, B. and Alemu, A., Phys. Rev. B 56, 12446 (1997).Google Scholar
29. Gil, B., Hamdani, F. and Morkoç, H., Phys. Rev. B 54, 7678 (1996).Google Scholar
30. Fischer, A. J., Shan, W., Song, J. J., Chang, Y. C., Horning, R. and Goldenberg, B., Appl. Phys. Lett. 71, 1981 (1997).Google Scholar
31. Leroux, M., Grandjean, N., Laügt, M., Massies, J., Gil, B., Lefebvre, P. and Bigenwald, P., Phys. Rev. B 58, R13371 (1998).Google Scholar
32. Lefebvre, P., Gallart, M., Taliercio, T., Gil, B., Allègre, J., Mathieu, H., Grandjean, N., Leroux, M., Massies, J. and Bigenwald, P., Phys. Stat. Sol. (b) 216, 361 (1999).Google Scholar
33. Chuang, S. L. and Chang, C. S., Phys. Rev. B 54, 2491 (1996).Google Scholar
34. Baker, A.S. and Illegems, S., Phys. Rev. B 7, 53 (1973).Google Scholar
35. Suzuki, M., Uenoyama, T. and Yanase, A., Phys. Rev. B 52, 8132 (1995).Google Scholar
36. Miller, D. A. B., Gossard, A. C. and Wiegmann, W., Optics Lett. 9, 162–164 (1984).Google Scholar